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1. 
Cover image for Microscopy of Semiconducting Materials 2007
Microscopy of Semiconducting Materials 2007
Author 
Cullis, A. G. editor. Midgley, P. A. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-8615-1
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2. 
Cover image for Transmission Electron Microscopy and Diffractometry of Materials
Transmission Electron Microscopy and Diffractometry of Materials
Author 
Fultz, Brent. author. Howe, James. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333265.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-29761-8
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3. 
Cover image for Transmission Electron Microscopy and Diffractometry of Materials
Transmission Electron Microscopy and Diffractometry of Materials
Author 
Fultz, Brent. author. Howe, James M. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-73886-2
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4. 
Cover image for Advanced microscopy : a strong analytical tool in materials science
Advanced microscopy : a strong analytical tool in materials science
Author 
Thomas, Merin Sara, editor. Haponiuk, Józef T., editor. Thomas, Sabu, editor. George, Anne, 1961- editor.
Preferred Shelf Number 
QH207
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003282044
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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5. 
Cover image for Fundamentals of crystallography, powder X-ray diffraction, and transmission electron microscopy for materials scientists
Fundamentals of crystallography, powder X-ray diffraction, and transmission electron microscopy for materials scientists
Author 
Dong, ZhiLi, author.
Preferred Shelf Number 
QD131 .D66 2022
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9780429351662
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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6. 
Cover image for Scanning transmission electron microscopy : advanced characterization methods for materials science applications
Scanning transmission electron microscopy : advanced characterization methods for materials science applications
Author 
Bruma, Alina, editor.
Preferred Shelf Number 
QH212 .S34 S33 2021
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9780429243011
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
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7. 
Cover image for Scanning Probe Microscopy of Functional Materials Nanoscale Imaging and Spectroscopy
Scanning Probe Microscopy of Functional Materials Nanoscale Imaging and Spectroscopy
Author 
Kalinin, Sergei V. editor. Gruverman, Alexei. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-7167-8
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8. 
Cover image for Transmission Electron Microscopy A Textbook for Materials Science
Transmission Electron Microscopy A Textbook for Materials Science
Author 
Williams, David B. author. Carter, C. Barry. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-76501-3
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9. 
Cover image for EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany Volume 2: Materials Science
EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany Volume 2: Materials Science
Author 
Richter, Silvia. editor. Schwedt, Alexander. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-85226-1
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10. 
Cover image for Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UK
Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UK
Author 
Cullis, A. G. editor. Hutchison, J. L. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/3-540-31915-8
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11. 
Cover image for Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
Author 
Vilarinho, Paula Maria. editor. Rosenwaks, Yossi. editor. Kingon, Angus. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/1-4020-3019-3
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12. 
Cover image for Characterization of High Tc Materials and Devices by Electron Microscopy
Characterization of High Tc Materials and Devices by Electron Microscopy
Author 
Browning, Nigel D.. Pennycook, Stephen J..
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ONLINE
Electronic Access 
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