Limit Search Results
Author
Wiley InterScience (Online service)
(2)
Abeyratne, Athula I., author.
(1)
Amberti, Daniele, author.
(1)
Amberti, Daniele, contributor.
(1)
American Institute of Chemical Engineers. Center for Chemical Process Safety.
(1)
Language
Publication Date
-
Subject
Reliability (Engineering) -- Statistical methods.
(17)
Electronic books.
(4)
Quality control -- Statistical methods.
(3)
Reliability (Engineering) -- Statistical methods
(3)
JMP (Computer file)
(2)
Material Type
Shelf Location
Switch to list view
Switch to thumbnail view
Select an Action
25 Results Found Subscribe to search results
000000000000DEFAULT
Print
1. 
Cover image for Reliability prediction for microelectronics
Reliability prediction for microelectronics
Author 
Bernstein, Joseph B., author. Bensoussan, Alain A., author. Bender, Emmanuel (Carl), author.
Preferred Shelf Number 
TK7874
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961
Format: 
Availability 
Online Library~1
Available:
Copies:
2. 
Cover image for Applied reliability for industry. 1, Predictive reliability for the automobile, aeronautics, defense, medical, marine and space industries
Applied reliability for industry. 1, Predictive reliability for the automobile, aeronautics, defense, medical, marine and space industries
Author 
El Hami, Abdelkhalak, editor. Delaux, David, editor. Grzeskowiak, Henri, editor.
Preferred Shelf Number 
TA169 .A67 2023
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781394208678
Format: 
Availability 
Online Library~1
Available:
Copies:
3. 
Cover image for Modeling remaining useful life dynamics in reliability engineering
Modeling remaining useful life dynamics in reliability engineering
Author 
Dersin, Pierre, author.
Preferred Shelf Number 
TS173
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003250685
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
Format: 
Availability 
Online Library~1
Available:
Copies:
4. 
Cover image for Reliability modelling with information measures
Reliability modelling with information measures
Author 
Nair, N. Unnikrishnan, 1945- author. Sunoj, S. M., 1972- author. Rajesh, G., 1971- author.
Preferred Shelf Number 
TA169 .N3526 2022 EB
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003309635
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
Format: 
Availability 
Online Library~1
Available:
Copies:
5. 
Cover image for Statistical modeling of reliability structures and industrial processes
Statistical modeling of reliability structures and industrial processes
Author 
Triantafyllou, Ioannis S., editor. Ram, Mangey, editor.
Preferred Shelf Number 
TA169
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003203124
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
Format: 
Availability 
Online Library~1
Available:
Copies:
6. 
Cover image for Design of experiments for reliability achievement
Design of experiments for reliability achievement
Author 
Rigdon, Steven E., 1955- author. Pan, Rong (Professor of reliability engineering), author. Montgomery, Douglas C., author. Freeman, Laura June, author.
Preferred Shelf Number 
TS173 .R54 2022
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119237754
Format: 
Availability 
Online Library~1
Available:
Copies:
7. 
Cover image for Stochastic models in reliability engineering
Stochastic models in reliability engineering
Author 
Cui, Lirong, 1960- editor. Frenkel, Ilia, 1950- editor. Lisnianski, Anatoly, editor.
Preferred Shelf Number 
TA169 .S759 2020 EB
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9780429331527
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
Format: 
Availability 
Online Library~1
Available:
Copies:
8. 
Cover image for Achieving Product Reliability : A Key to Business Success.
Achieving Product Reliability : A Key to Business Success.
Author 
Doganaksoy, Necip, 1960- author. Meeker, William Q., author. Hahn, Gerald J., author.
Preferred Shelf Number 
TS156
Electronic Access 
Taylor & Francis https://www.taylorfrancis.com/books/9781003181361
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf
Format: 
Availability 
Online Library~1
Available:
Copies:
9. 
Cover image for Applications and metrology at nanometer scale. 1, Smart materials, electromagnetic waves and uncertainties
Applications and metrology at nanometer scale. 1, Smart materials, electromagnetic waves and uncertainties
Author 
Dahoo, Pierre Richard. Pougnet, Philippe. El Hami, Abdelkhalak.
Preferred Shelf Number 
QC88
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119808244
Format: 
Availability 
Online Library~1
Available:
Copies:
10. 
Cover image for Modern industrial statistics : with applications in R, MINITAB and JMP
Modern industrial statistics : with applications in R, MINITAB and JMP
Author 
Kenett, Ron, author. Zacks, Shelemyahu, 1932- author. Amberti, Daniele, author.
Preferred Shelf Number 
TS156 .K46 2021
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119714941
Format: 
Availability 
Online Library~1
Available:
Copies:
11. 
Cover image for Practical applications of Bayesian reliability
Practical applications of Bayesian reliability
Author 
Liu, Yan, author. Abeyratne, Athula I., author.
Preferred Shelf Number 
QA279.5
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119287995
Format: 
Availability 
Online Library~1
Available:
Copies:
12. 
Cover image for Robust statistics : theory and methods (with R)
Robust statistics : theory and methods (with R)
Author 
Maronna, Ricardo A., author. Martin, R. Douglas, author. Yohai, Víctor J., author.
Preferred Shelf Number 
QA276 .M336 2019
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119214656
Format: 
Availability 
Online Library~1
Available:
Copies: