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1. 
Cover image for The Science of Solar System Ices
The Science of Solar System Ices
Author 
Gudipati, Murthy S. editor. Castillo-Rogez, Julie. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(331315.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-3076-6
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2. 
Cover image for Transition-Metal Defects in Silicon New Insights from Photoluminescence Studies of Highly Enriched 28Si
Transition-Metal Defects in Silicon New Insights from Photoluminescence Studies of Highly Enriched 28Si
Author 
Steger, Michael. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333931.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-35079-5
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3. 
Cover image for ICAME 2011 Proceedings of the 31st International Conference on the Applications of the Mössbauer Effect (ICAME 2011) held in Tokyo, Japan, 25-30 September 2011
ICAME 2011 Proceedings of the 31st International Conference on the Applications of the Mössbauer Effect (ICAME 2011) held in Tokyo, Japan, 25-30 September 2011
Author 
Yoshida, Yutaka. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(335817.1)
Electronic Access 
http://dx.doi.org/10.1007/978-94-007-4762-3
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4. 
Cover image for Materials and Reliability Handbook for Semiconductor Optical and Electron Devices
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices
Author 
Ueda, Osamu. editor. Pearton, Stephen J. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(331478.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-4337-7
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5. 
Cover image for Handbook of Coherent-Domain Optical Methods Biomedical Diagnostics, Environmental Monitoring, and Materials Science
Handbook of Coherent-Domain Optical Methods Biomedical Diagnostics, Environmental Monitoring, and Materials Science
Author 
Tuchin, Valery V. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(331699.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-5176-1
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6. 
Cover image for Evaluating Measurement Accuracy A Practical Approach
Evaluating Measurement Accuracy A Practical Approach
Author 
Rabinovich, Semyon G. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(332097.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-6717-5
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7. 
Cover image for Optical Absorption of Impurities and Defects in Semiconducting Crystals Electronic Absorption of Deep Centres and Vibrational Spectra
Optical Absorption of Impurities and Defects in Semiconducting Crystals Electronic Absorption of Deep Centres and Vibrational Spectra
Author 
Pajot, Bernard. author. Clerjaud, Bernard. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333081.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-18018-7
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8. 
Cover image for Scanning Probe Microscopy in Nanoscience and Nanotechnology 3
Scanning Probe Microscopy in Nanoscience and Nanotechnology 3
Author 
Bhushan, Bharat. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333137.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-25414-7
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9. 
Cover image for Acoustic Scanning Probe Microscopy
Acoustic Scanning Probe Microscopy
Author 
Marinello, Francesco. editor. Passeri, Daniele. editor. Savio, Enrico. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333153.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-27494-7
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10. 
Cover image for Resonance Effects of Excitons and Electrons Basics and Applications
Resonance Effects of Excitons and Electrons Basics and Applications
Author 
Geru, Ion. author. Suter, Dieter. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(334053.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-35807-4
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11. 
Cover image for Attosecond Physics Attosecond Measurements and Control of Physical Systems
Attosecond Physics Attosecond Measurements and Control of Physical Systems
Author 
Plaja, Luis. editor. Torres, Ricardo. editor. Zaïr, Amelle. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(334463.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-37623-8
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12. 
Cover image for Transmission Electron Microscopy and Diffractometry of Materials
Transmission Electron Microscopy and Diffractometry of Materials
Author 
Fultz, Brent. author. Howe, James. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333265.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-29761-8
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