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1. 
Cover image for Ion beam handbook for material analysis
Ion beam handbook for material analysis
Author 
Mayer, James W., 1930- Rimini, E.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780124808607
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2. 
Cover image for Ion implantation in semiconductors, silicon and germanium
Ion implantation in semiconductors, silicon and germanium
Author 
Mayer, James W., 1930- Eriksson, Lennart, 1938- author. Davies, John Arthur, 1927- author.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780124808508
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3. 
Cover image for Laser annealing of semiconductors
Laser annealing of semiconductors
Author 
Poate, J. M. Mayer, James W., 1930-
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780125588201
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4. 
Cover image for Ion beam analysis : fundamentals and applications
Ion beam analysis : fundamentals and applications
Author 
Nastasi, Michael Anthony, 1950- author. Mayer, James W., 1930- author. Wang, Yongqiang (Nuclear physicist), author.
Preferred Shelf Number 
ONLINE(356970.1)
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
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5. 
Cover image for Materials analysis by ion channeling submicron crystallography
Materials analysis by ion channeling submicron crystallography
Author 
Feldman, Leonard C. Mayer, James W., 1930- Picraux, S. T., 1943-
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780122526800
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6. 
Cover image for Backscattering spectrometry
Backscattering spectrometry
Author 
Chu, Wei-Kan. Mayer, James W., 1930- joint author. Nicolet, Marc-A., joint author.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780121738501
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