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Cover image for Data reconciliation & gross error detection an intelligent use of process data
Data reconciliation & gross error detection an intelligent use of process data
Author 
Narasimhan, Shankar. Jordache, Cornelius.
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ScienceDirect http://www.sciencedirect.com/science/book/9780884152552
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2. 
Cover image for Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992
Semiconductor materials analysis and fabrication process control proceedings of Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control of the 1992 E-MRS Spring Conference, Strasbourg, France, June 2-5, 1992
Author 
Symposium D on Diagnostic Techniques for Semiconductor Materials Analysis and Fabrication Process Control (1992 : Strasbourg, France) Crean, G. M. Stuck, R. Woollam, John A. European Materials Research Society.
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ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780444899088
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