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1. 
Cover image for Testing for small-delay defects in nanoscale CMOS integrated circuits
Testing for small-delay defects in nanoscale CMOS integrated circuits
Author 
Goel, Sandeep K, editor of compilation. Chakrabarty, Krishnendu, editor of compilation.
Preferred Shelf Number 
ONLINE(342881.1)
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
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2. 
Cover image for RF and microwave modeling and measurement techniques for field effect transistors
RF and microwave modeling and measurement techniques for field effect transistors
Author 
Gao, Jianjun, 1968- Knovel (Firm)
Preferred Shelf Number 
ONLINE
Electronic Access 
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=571541
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3. 
Cover image for Semiconductor material and device characterization
Semiconductor material and device characterization
Author 
Schroder, Dieter K.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5237928
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4. 
Cover image for Surface analysis with STM and AFM experimental and theoretical aspects of image analysis
Surface analysis with STM and AFM experimental and theoretical aspects of image analysis
Author 
Magonov, Sergei N. Whangbo, Myung-Hwan. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9783527615117
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5. 
Cover image for Principles of semiconductor network testing
Principles of semiconductor network testing
Author 
Afshar, Amir.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780750694728
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6. 
Cover image for Optical characterization of semiconductors infrared, Raman, and photoluminescence spectroscopy
Optical characterization of semiconductors infrared, Raman, and photoluminescence spectroscopy
Author 
Perkowitz, S.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780125507707
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