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1. 
Cover image for X-ray diffraction : modern experimental techniques
X-ray diffraction : modern experimental techniques
Author 
Seeck, Oliver H., editor. Murphy, Bridget M., editor.
Preferred Shelf Number 
ONLINE(342857.1)
Electronic Access 
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2. 
Cover image for Structure from diffraction methods
Structure from diffraction methods
Author 
Bruce, Duncan W., editor. O'Hare, Dermot, editor. Walton, Richard I., editor.
Preferred Shelf Number 
QD461 .S9255 2014
Electronic Access 
http://onlinelibrary.wiley.com/book/10.1002/9781118695708
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3. 
Cover image for Modern diffraction methods
Modern diffraction methods
Author 
Mittemeijer, E. J. Welzel, Udo. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Connect to MyiLibrary resource.
John Wiley http://dx.doi.org/10.1002/9783527649884
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4. 
Cover image for X-rays and materials
X-rays and materials
Author 
Goudeau, Philippe. Guinebretière, René.
Preferred Shelf Number 
ONLINE
Electronic Access 
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John Wiley http://dx.doi.org/10.1002/9781118562888
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5. 
Cover image for Crystals, x-rays and proteins comprehensive protein crystallography
Crystals, x-rays and proteins comprehensive protein crystallography
Author 
Sherwood, Dennis. Cooper, Jon (Jonathan B.)
Preferred Shelf Number 
ONLINE
Electronic Access 
Oxford scholarship online http://dx.doi.org/10.1093/acprof:oso/9780199559046.001.0001
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6. 
Cover image for Two-dimensional x-ray diffraction
Two-dimensional x-ray diffraction
Author 
He, Bob B., 1954-
Preferred Shelf Number 
ONLINE
Electronic Access 
Books24x7 http://www.books24x7.com/marc.asp?bookid=33634
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=469502
John Wiley http://dx.doi.org/10.1002/9780470502648
http://site.ebrary.com/lib/alltitles/Doc?id=10346379
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7. 
Cover image for Principles and applications of powder diffraction
Principles and applications of powder diffraction
Author 
Clearfield, Abraham. Reibenspies, Joseph Henry. Bhuvanesh, Nattamai. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9781444305487
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8. 
Cover image for X-ray diffraction by polycrystalline materials
X-ray diffraction by polycrystalline materials
Author 
Guinebretiere, Rene. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Contributor biographical information http://catdir.loc.gov/catdir/enhancements/fy0704/2006037726-b.html
John Wiley http://dx.doi.org/10.1002/9780470612408
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9. 
Cover image for X-ray metrology in semiconductor manufacturing
X-ray metrology in semiconductor manufacturing
Author 
Bowen, D. Keith (David Keith), 1940- Tanner, B. K. (Brian Keith)
Preferred Shelf Number 
ONLINE
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10. 
Cover image for Collection of simulated XRD powder patterns for zeolites
Collection of simulated XRD powder patterns for zeolites
Author 
Treacy, M. M. J. (Michael M. J.) Higgins, John B. Treacy, M. M. J. (Michael M. J.). Collection of simulated XRD powder patterns for zeolites. International Zeolite Association. Structure Commission.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780444507020
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11. 
Cover image for Introduction to X-ray powder diffractometry
Introduction to X-ray powder diffractometry
Author 
Jenkins, Ron, 1932- Snyder, R. L. (Robert L.), 1941-
Preferred Shelf Number 
ONLINE
Electronic Access 
HathiTrust Digital Library, Limited view (search only) http://catalog.hathitrust.org/api/volumes/oclc/34476835.html
John Wiley http://dx.doi.org/10.1002/9781118520994
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