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1. 
Cover image for VLSI Design and Test for Systems Dependability
VLSI Design and Test for Systems Dependability
Author 
Asai, Shojiro. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-4-431-56594-9
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2. 
Cover image for VLSI Design and Test 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers
VLSI Design and Test 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers
Author 
Rajaram, S. editor. Balamurugan, N.B. editor. Gracia Nirmala Rani, D. editor. Singh, Virendra. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-13-5950-7
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3. 
Cover image for Test Generation of Crosstalk Delay Faults in VLSI Circuits
Test Generation of Crosstalk Delay Faults in VLSI Circuits
Author 
Jayanthy, S. author. Bhuvaneswari, M.C. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-13-2493-2
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4. 
Cover image for VLSI Design and Test 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers
VLSI Design and Test 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers
Author 
Sengupta, Anirban. editor. Dasgupta, Sudeb. editor. Singh, Virendra. editor. Sharma, Rohit. editor. Kumar Vishvakarma, Santosh. editor.
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https://doi.org/10.1007/978-981-32-9767-8
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5. 
Cover image for VLSI Design and Test 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers
VLSI Design and Test 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers
Author 
Gaur, Manoj Singh. editor. Zwolinski, Mark. editor. Laxmi, Vijay. editor. Boolchandani, Dharmendra. editor. Sing, Virendra. editor.
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ONLINE(335156.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-42024-5
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6. 
Cover image for Progress in VLSI Design and Test 16th International Symposium, VDAT 2012, Shibpur, India, July 1-4, 2012. Proceedings
Progress in VLSI Design and Test 16th International Symposium, VDAT 2012, Shibpur, India, July 1-4, 2012. Proceedings
Author 
Rahaman, Hafizur. editor. Chattopadhyay, Sanatan. editor. Chattopadhyay, Santanu. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-642-31494-0
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7. 
Cover image for VLSI test principles and architectures design for testability
VLSI test principles and architectures design for testability
Author 
Wang, Laung-Terng. Wu, Cheng-Wen, EE Ph. D. Wen, Xiaoqing.
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ScienceDirect http://www.sciencedirect.com/science/book/9780123705976
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8. 
Cover image for Advanced research in VLSI proceedings of the fifth MIT conference, March 1988
Advanced research in VLSI proceedings of the fifth MIT conference, March 1988
Author 
Allen, Jonathan, 1934- Leighton, Frank Thomson. Massachusetts Institute of Technology. Microsystems Research Center. MIT Conference on Advanced Research in VLSI (5th : 1988 : Cambridge, Mass.)
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276833
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9. 
Cover image for Logic testing and design for testability
Logic testing and design for testability
Author 
Fujiwara, Hideo.
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267264
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