Limit Search Results
Author
Language
Subject
Material Type
Shelf Location
Library
Switch to list view
Switch to thumbnail view
Select an Action
2 Results Found Subscribe to search results
00DEFAULT
Print
1. 
Cover image for Physical measurement and analysis of thin films
Physical measurement and analysis of thin films
Author 
Eastern Analytical Symposium (1967 : New York). Murt, E. M., ed. Guldner, W. G., ed.
Preferred Shelf Number 
QC 176 E2 1967
Format: 
Availability 
Beytepe Library~1
Available:
Copies:
2. 
Cover image for Thin film phenomena
Thin film phenomena
Author 
Chopra, Kasturi L., 1933-
Preferred Shelf Number 
QC 176.8.T5 C55 1969
Format: 
Availability 
Beytepe Library~1
Available:
Copies: