Cover image for Computed electron micrographs and defect identification
Title:
Computed electron micrographs and defect identification
Author:
Head, A. K.
Publication Information:
Amsterdam : Horth-Holland, 1973.
Physical Description:
400 s.
Series:
Defects in crystalline solids ; v. 7
Series Title:
Defects in crystalline solids ; v. 7
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Book 7.2/12/584870 QD 901 D4 1973 C7
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