Limit Search Results
Author
Language
Subject
Material Type
Shelf Location
Library
Switch to list view
Switch to thumbnail view
Select an Action
2 Results Found Subscribe to search results
00DEFAULT
Print
1. 
Cover image for Logic testing and design for testability
Logic testing and design for testability
Author 
Fujiwara, Hideo.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267264
Format: 
Availability 
Online Library~1
Available:
Copies:
2. 
Cover image for Fundamentals of logic design
Fundamentals of logic design
Author 
Roth, Charles H.
Preferred Shelf Number 
TK 7868.L6 R67 1985
Format: 
Availability 
Beytepe Library~1
Available:
Copies: