Title:
Electronics reliability and measurement technology nondestructive evaluation
Author:
Heyman, Joseph S.
ISBN:
9781591240518
9780815511717
9780815516996
Publication Information:
Park Ridge, N.J., U.S.A. : Noyes Data Corp., ©1988.
Physical Description:
1 online resource (xii, 128 pages) : illustrations
Added Author:
Electronic Access:
ScienceDirect http://www.sciencedirect.com/science/book/9780815511717Copies:
Available:*
Library | Material Type | Item Barcode | Shelf Number | Status | Item Holds |
|---|---|---|---|---|---|
Searching... | E-Book | 254151-1001 | ONLINE | Searching... | Searching... |