Cover image for Principles of semiconductor network testing
Title:
Principles of semiconductor network testing
Author:
Afshar, Amir.
ISBN:
9780750694728
Publication Information:
Boston : Butterworth-Heinemann, c1995.
Physical Description:
1 online resource (xiv, 213 p.) : ill.
Subject Term:
Integrated circuits -- Testing.

Semiconductors -- Testing.
Electronic Access:
ScienceDirect http://www.sciencedirect.com/science/book/9780750694728
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