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Cover image for Defects in microelectronic materials and devices
Defects in microelectronic materials and devices
Author 
Fleetwood, Daniel. Pantelides, Sokrates T. Schrimpf, Ronald Donald.
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Cover image for Electronic device architectures for the nano-CMOS era from ultimate CMOS scaling to beyond CMOS devices
Electronic device architectures for the nano-CMOS era from ultimate CMOS scaling to beyond CMOS devices
Author 
Deleonibus, Simon.
Preferred Shelf Number 
ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
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