Switch to list view
Switch to thumbnail view
Select an Action
4 Results Found Subscribe to search results
0000DEFAULT
Print
1. 
Cover image for Electronic device architectures for the nano-CMOS era from ultimate CMOS scaling to beyond CMOS devices
Electronic device architectures for the nano-CMOS era from ultimate CMOS scaling to beyond CMOS devices
Author 
Deleonibus, Simon.
Preferred Shelf Number 
ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
Format: 
Availability 
Online Library~1
Available:
Copies:
2. 
Cover image for Reliability wearout mechanisms in advanced CMOS technologies
Reliability wearout mechanisms in advanced CMOS technologies
Author 
Strong, Alvin Wayne, 1946-
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029
Format: 
Availability 
Online Library~1
Available:
Copies:
3. 
Cover image for Transient-induced latchup in CMOS integrated circuits
Transient-induced latchup in CMOS integrated circuits
Author 
Ker, Ming-Dou. Hsu, Sheng-Fu.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5453758
Format: 
Availability 
Online Library~1
Available:
Copies:
4. 
Cover image for Nano-CMOS design for manufacturability robust circuit and physical design for sub-65 nm technology nodes
Nano-CMOS design for manufacturability robust circuit and physical design for sub-65 nm technology nodes
Author 
Wong, Ban P., 1953-
Preferred Shelf Number 
ONLINE
Electronic Access 
Click here to view book
Knovel http://app.knovel.com/web/toc.v/cid:kpNCMOSDM2
John Wiley http://dx.doi.org/10.1002/9780470382820
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=413074_0
http://site.ebrary.com/lib/alltitles/Doc?id=10278707
Format: 
Availability 
Online Library~1
Available:
Copies: