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1. 
Cover image for Electrostatic discharge understand, simulate and fix ESD problems
Electrostatic discharge understand, simulate and fix ESD problems
Author 
Mardiguian, Michel.
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ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361037
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2. 
Cover image for Reliability wearout mechanisms in advanced CMOS technologies
Reliability wearout mechanisms in advanced CMOS technologies
Author 
Strong, Alvin Wayne, 1946-
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ONLINE
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029
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3. 
Cover image for Advanced signal integrity for high-speed digital designs
Advanced signal integrity for high-speed digital designs
Author 
Hall, Stephen H. Heck, Howard L.
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ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361024
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4. 
Cover image for Circuits at the nanoscale : communications, imaging, and sensing
Circuits at the nanoscale : communications, imaging, and sensing
Author 
Iniewski, Krzysztof.
Preferred Shelf Number 
TK7874.84 .C57 2009
Electronic Access 
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