Switch to list view
Switch to thumbnail view
Select an Action
2 Results Found Subscribe to search results
00DEFAULT
Print
1. 
Cover image for Testing Complex and Embedded Systems
Testing Complex and Embedded Systems
Author 
Pries, Kim H., author. Quigley, Jon M., author. Taylor and Francis.
Preferred Shelf Number 
TK7895 .E42
Electronic Access 
Click here to view
Format: 
Availability 
Online Library~1
Available:
Copies:
2. 
Cover image for Mobile intelligence
Mobile intelligence
Author 
Yang, Laurence Tianruo.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5732776
Format: 
Availability 
Online Library~1
Available:
Copies: