Title:
Extreme Statistics in Nanoscale Memory Design
Author:
Singhee, Amith. editor.
ISBN:
9781441966063
Edition:
1.
Physical Description:
X, 246 p. online resource.
Series:
Integrated Circuits and Systems,
Series Title:
Integrated Circuits and Systems, 1558-9412
Added Author:
Added Corporate Author:
Electronic Access:
http://dx.doi.org/10.1007/978-1-4419-6606-3Copies:
Available:*
Library | Material Type | Item Barcode | Shelf Number | Status | Item Holds |
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Searching... | E-Book | 172640-2001 | ONLINE | Searching... | Searching... |