Limit Search Results
Author
Language
Subject
Material Type
Shelf Location
Library
Switch to list view
Switch to thumbnail view
Select an Action
8 Results Found Subscribe to search results
00000000DEFAULT
Print
1. 
Cover image for Information Modeling for Interoperable Dimensional Metrology
Information Modeling for Interoperable Dimensional Metrology
Author 
Zhao, Yaoyao (Fiona). author. Brown, Robert. author. Kramer, Thomas R. author. Xu, Xun. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4471-2167-1
Format: 
Availability 
Online Library~1
Available:
Copies:
2. 
Cover image for Springer Handbook of Metrology and Testing
Springer Handbook of Metrology and Testing
Author 
Czichos, Horst. editor. Saito, Tetsuya. editor. Smith, Leslie. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-16641-9
Format: 
Availability 
Online Library~1
Available:
Copies:
3. 
Cover image for Distributed Large-Scale Dimensional Metrology New Insights
Distributed Large-Scale Dimensional Metrology New Insights
Author 
Franceschini, Fiorenzo. author. Galetto, Maurizio. author. Maisano, Domenico. author. Mastrogiacomo, Luca. author. Pralio, Barbara. author.
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-85729-543-9
Format: 
Availability 
Online Library~1
Available:
Copies:
4. 
Cover image for Advances in speckle metrology and related techniques
Advances in speckle metrology and related techniques
Author 
Kaufmann, Guillermo H.
Preferred Shelf Number 
ONLINE
Electronic Access 
Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Wiley InterScience - Full Text Online http://onlinelibrary.wiley.com/book/10.1002/9783527633852
http://site.ebrary.com/lib/alltitles/Doc?id=10446636
Format: 
Availability 
Online Library~1
Available:
Copies:
5. 
Cover image for Digital holography for MEMS and microsystem metrology
Digital holography for MEMS and microsystem metrology
Author 
Asundi, Anand.
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9781119997290
http://lib.myilibrary.com?id=317798
http://public.eblib.com/EBLPublic/PublicView.do?ptiID=697681
Format: 
Availability 
Online Library~1
Available:
Copies:
6. 
Cover image for Optical Measurements, Modeling, and Metrology, Volume 5 Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics
Optical Measurements, Modeling, and Metrology, Volume 5 Proceedings of the 2011 Annual Conference on Experimental and Applied Mechanics
Author 
Proulx, Tom. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-0228-2
Format: 
Availability 
Online Library~1
Available:
Copies:
7. 
Cover image for Handbook of surface and nanometrology
Handbook of surface and nanometrology
Author 
Whitehouse, D. J. (David J.), author. Whitehouse, D. J. (David J.). Handbook of surface metrology.
Preferred Shelf Number 
TA418.7 .W47 2011
Electronic Access 
Click here to view.
Format: 
Availability 
Online Library~1
Available:
Copies:
8. 
Cover image for Computer network time synchronization : the Network Time Protocol on Earth and in space
Computer network time synchronization : the Network Time Protocol on Earth and in space
Author 
Mills, David L., author.
Preferred Shelf Number 
TK5105.575 .M55 2011
Electronic Access 
Click here to view.
Format: 
Availability 
Online Library~1
Available:
Copies: