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1. 
Cover image for Semiconductor devices : physics and technology
Semiconductor devices : physics and technology
Author 
Sze, S. M., 1936- Lee, M. K.
Preferred Shelf Number 
TK7871.85 S9883 2013
Format: 
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Beytepe Library~1
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2. 
Cover image for Semiconductor Lasers Stability, Instability and Chaos
Semiconductor Lasers Stability, Instability and Chaos
Author 
Ohtsubo, Junji. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333297.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-30147-6
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3. 
Cover image for Materials and Reliability Handbook for Semiconductor Optical and Electron Devices
Materials and Reliability Handbook for Semiconductor Optical and Electron Devices
Author 
Ueda, Osamu. editor. Pearton, Stephen J. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(331478.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-4337-7
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4. 
Cover image for Low Dimensional Semiconductor Structures Characterization, Modeling and Applications
Low Dimensional Semiconductor Structures Characterization, Modeling and Applications
Author 
Ünlü, Hilmi. editor. Horing, Norman J. M. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333183.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-28424-3
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5. 
Cover image for All-Optical Noninvasive Delayed Feedback Control of Semiconductor Lasers
All-Optical Noninvasive Delayed Feedback Control of Semiconductor Lasers
Author 
Schikora, Sylvia. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(335268.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-658-01540-4
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6. 
Cover image for Semiconductor Laser Engineering, Reliability and Diagnostics a Practical Approach to High Power and Single Mode Devices.
Semiconductor Laser Engineering, Reliability and Diagnostics a Practical Approach to High Power and Single Mode Devices.
Author 
Epperlein, Peter W.
Preferred Shelf Number 
ONLINE
Electronic Access 
Ebook Library http://public.eblib.com/EBLPublic/PublicView.do?ptiID=1118506
John Wiley http://dx.doi.org/10.1002/9781118481882
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7. 
Cover image for Nitride semiconductor light-emitting diodes (LEDs) materials, technologies and applications
Nitride semiconductor light-emitting diodes (LEDs) materials, technologies and applications
Author 
Huang, Jian-Jang, editor. Kuo, Hao-Chung, editor. Shen, Shyh-Chiang, editor.
Preferred Shelf Number 
ONLINE(356017.1)
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780857095077
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8. 
Cover image for Production Planning and Control for Semiconductor Wafer Fabrication Facilities Modeling, Analysis, and Systems
Production Planning and Control for Semiconductor Wafer Fabrication Facilities Modeling, Analysis, and Systems
Author 
Mönch, Lars. author. Fowler, John W. author. Mason, Scott J. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(331515.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-4472-5
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9. 
Cover image for Solid state electronic devices
Solid state electronic devices
Author 
Bhattacharya, D. K., author. Sharma, Rajnish (Semiconductor scientist), author.
Preferred Shelf Number 
TK7871.85 B45 2013
Format: 
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10. 
Cover image for Sapphire structure, technology, and applications
Sapphire structure, technology, and applications
Author 
Tartaglia, Isaias, editor of compilation.
Preferred Shelf Number 
ONLINE
Electronic Access 
EBSCOhost http://search.ebscohost.com/login.aspx?direct=true&scope=site&db=nlebk&db=nlabk&AN=548982
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11. 
Cover image for SOI lubistors : lateral, unidirectional, bipolar-type insulated-gate transistors
SOI lubistors : lateral, unidirectional, bipolar-type insulated-gate transistors
Author 
Omura, Y. (Yasuhisa)
Preferred Shelf Number 
ONLINE(341557.1)
Electronic Access 
http://dx.doi.org/10.1002/9781118487914
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12. 
Cover image for Quantum dot sensors : technology and commercial applications
Quantum dot sensors : technology and commercial applications
Author 
Callan, John F. (John Francis), editor. Raymo, Fran�isco M., editor.
Preferred Shelf Number 
TK7874.88 .Q36 2013
Electronic Access 
Click here to view.
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