Title:
Testing for small-delay defects in nanoscale CMOS integrated circuits
Author:
Goel, Sandeep K, editor of compilation.
ISBN:
9781439829424
Physical Description:
1 online resource : text file, PDF
Series:
Devices, circuits, and systems
Devices, circuits, and systems.
Subject Term:
Holds:
Copies:
Available:*
Library | Material Type | Item Barcode | Shelf Number | Status | Item Holds |
|---|---|---|---|---|---|
Searching... | E-Book | 342881-1001 | ONLINE(342881.1) | Searching... | Searching... |