Title:
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Author:
Franco, Jacopo. author.
ISBN:
9789400776630
Edition:
1st ed. 2014.
Physical Description:
XIX, 187 p. 219 illus. online resource.
Series:
Springer Series in Advanced Microelectronics, 47
Added Corporate Author:
Electronic Access:
https://doi.org/10.1007/978-94-007-7663-0Copies:
Available:*
Library | Material Type | Item Barcode | Shelf Number | Status | Item Holds |
|---|---|---|---|---|---|
Searching... | E-Book | 489246-1001 | ONLINE | Searching... | Searching... |