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1. 
Cover image for Adhesion in microelectronics
Adhesion in microelectronics
Author 
Mittal, K. L., 1945- editor. Ahsan, Tanweer, editor.
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ONLINE(341844.1)
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ebrary An electronic book accessible through the World Wide Web; click to view
Ebook Library http://public.eblib.com/choice/PublicFullRecord.aspx?p=1767917
John Wiley http://dx.doi.org/10.1002/9781118831373
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2. 
Cover image for Materials science in microelectronics
Materials science in microelectronics
Author 
Machlin, E. S.
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ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780080446394
ScienceDirect http://www.sciencedirect.com/science/book/9780080446400
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3. 
Cover image for The Non-Equilibrium Green's Function Method for Nanoscale Device Simulation
The Non-Equilibrium Green's Function Method for Nanoscale Device Simulation
Author 
Pourfath, Mahdi. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-7091-1800-9
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4. 
Cover image for Analog Filters in Nanometer CMOS
Analog Filters in Nanometer CMOS
Author 
Uhrmann, Heimo. author. Kolm, Robert. author. Zimmermann, Horst. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-642-38013-6
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5. 
Cover image for Poly-SiGe for MEMS-above-CMOS Sensors
Poly-SiGe for MEMS-above-CMOS Sensors
Author 
Gonzalez Ruiz, Pilar. author. De Meyer, Kristin. author. Witvrouw, Ann. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-94-007-6799-7
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6. 
Cover image for Flash Memories Economic Principles of Performance, Cost and Reliability Optimization
Flash Memories Economic Principles of Performance, Cost and Reliability Optimization
Author 
Richter, Detlev. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-94-007-6082-0
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7. 
Cover image for Stochastic Process Variation in Deep-Submicron CMOS Circuits and Algorithms
Stochastic Process Variation in Deep-Submicron CMOS Circuits and Algorithms
Author 
Zjajo, Amir. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-94-007-7781-1
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8. 
Cover image for Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Reliability of High Mobility SiGe Channel MOSFETs for Future CMOS Applications
Author 
Franco, Jacopo. author. Kaczer, Ben. author. Groeseneken, Guido. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-94-007-7663-0
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9. 
Cover image for Design Exploration of Emerging Nano-scale Non-volatile Memory
Design Exploration of Emerging Nano-scale Non-volatile Memory
Author 
Yu, Hao. author. Wang, Yuhao. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-1-4939-0551-5
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10. 
Cover image for Unifying Electrical Engineering and Electronics Engineering Proceedings of the 2012 International Conference on Electrical and Electronics Engineering
Unifying Electrical Engineering and Electronics Engineering Proceedings of the 2012 International Conference on Electrical and Electronics Engineering
Author 
Xing, Song. editor. Chen, Suting. editor. Wei, Zhanming. editor. Xia, Jingming. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-1-4614-4981-2
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11. 
Cover image for High Performance Multi-Channel High-Speed I/O Circuits
High Performance Multi-Channel High-Speed I/O Circuits
Author 
Oh, Taehyoun. author. Harjani, Ramesh. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-1-4614-4963-8
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12. 
Cover image for Video Surveillance for Sensor Platforms Algorithms and Architectures
Video Surveillance for Sensor Platforms Algorithms and Architectures
Author 
Al Najjar, Mayssaa. author. Ghantous, Milad. author. Bayoumi, Magdy. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-1-4614-1857-3
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