Cover image for Testing for small-delay defects in nanoscale CMOS integrated circuits
Title:
Testing for small-delay defects in nanoscale CMOS integrated circuits
Author:
Goel, Sandeep K, editor of compilation.
ISBN:
9781439829424
Physical Description:
1 online resource : text file, PDF
Series:
Devices, circuits, and systems

Devices, circuits, and systems.
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