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Publication Date: 2015

Author

SpringerLink (Online service)

(73)

Azar, Ahmad Taher. editor.

(2)

Fakhfakh, Mourad. editor.

(2)

Hausken, Kjell. editor.

(2)

Kim, Kuinam J. editor.

(2)

Koornneef, Floor. editor.

(2)

Matsagar, Vasant. editor.

(2)

Papadrakakis, Manolis. editor.

(2)

Siarry, Patrick. editor.

(2)

Sugier, Jarosław. editor.

(2)

Tlelo-Cuautle, Esteban. editor.

(2)

Zamojski, Wojciech. editor.

(2)

Zhuang, Jun. editor.

(2)

van Gulijk, Coen. editor.

(2)

Abrahamsson, Pekka. editor.

(1)

Adams, Kevin MacG. author.

(1)

Ajit, Srividya. author.

(1)

Akram, Raja Naeem. editor.

(1)

Alampalli, Sreenivas.

(1)

Ao, Sio-Iong. editor.

(1)

Armenio, Vincenzo. editor.

(1)

Au, Ivan Siu-Kui. editor.

(1)

Barolli, Admir. editor.

(1)

Barolli, Leonard. editor.

(1)

Beer, Michael. editor.

(1)

Bekki, Daisuke. editor.

(1)

Bessani, Alysson. editor.

(1)

Bhushan, Manjul. author.

(1)

Bieler, Thomas R. author.

(1)

Blair, Alan D. editor.

(1)

Bondi, André B., author.

(1)

Bouchenak, Sara. editor.

(1)

Buchberger, Bruno. editor.

(1)

Calude, Cristian S. editor.

(1)

Cao, Yu. editor.

(1)

Chakrabarti, Amaresh. editor.

(1)

Chalup, Stephan. editor.

(1)

Chen, Fred. author.

(1)

Chmaj, Grzegorz. editor.

(1)

Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida)

(1)

Corral, Luis. editor.

(1)

Coupé, Pierrick. editor.

(1)

Cristofolini, Luca. author.

(1)

Dash, Subhransu Sekhar. editor.

(1)

Davim, J. Paulo. editor. (orcid)0000-0002-5659-3111

(1)

Dinneen, Michael J. editor.

(1)

Du, Dingzhu. editor.

(1)

Du, Donglei. editor.

(1)

Duffuaa, Salih O. author.

(1)

El Hami, Abdelkhalak. editor.

(1)

El-Kareh, Badih. author.

(1)

Elleithy, Khaled. editor.

(1)

Ettouney, Mohammed.

(1)

European Safety and Reliability Conference (2014 : Wroc¿̐ưaw, Poland)

(1)

Fazlollahtabar, Hamed. author.

(1)

Feyrer, Klaus. author.

(1)

Fischer-Hirchert, Ulrich H. P. author.

(1)

Fox, Jonathan, 1968- author.

(1)

Freddi, Alessandro. author.

(1)

Fröhlich, Jochen. editor.

(1)

Galván, Blas. editor.

(1)

Gauger, Nicolas. editor.

(1)

Gelman, Len. editor.

(1)

Gen, Mitsuo. editor.

(1)

Geurts, Bernard J. editor.

(1)

Giannakoglou, Kyriakos. editor.

(1)

Grabski, Franciszek, author.

(1)

Greiner, David. editor.

(1)

Harris, Don. editor.

(1)

Hiroshi, Yabe. editor.

(1)

Holliday, Wesley H. editor.

(1)

Huang, Xiaoxia. editor.

(1)

Hunold, Sascha. editor.

(1)

Hutter, Lou N. author.

(1)

Ibe, Eishi H., author.

(1)

Ippoliti, Emiliano. editor.

(1)

Jajodia, Sushil. editor.

(1)

Jiang, Renyan. author.

(1)

Kacprzyk, Janusz. editor.

(1)

Kadry, Seifedine. editor.

(1)

Kam, Hei. author.

(1)

Kamalakannan, C. editor.

(1)

Ketchen, Mark B. author.

(1)

Khan, Samee U. editor.

(1)

Kim, Choong-Un. author.

(1)

Ko, C.N. editor.

(1)

Kougioumtzoglou, Ioannis A. editor.

(1)

Kuerten, Hans. editor.

(1)

Kuzmanić, Ivica. author.

(1)

Lagaros, Nikos D. editor.

(1)

Lam, Rocky. editor.

(1)

Lee, Tae-Kyu. author.

(1)

Liu, Baoding. author.

(1)

Liu, Yong. author.

(1)

Ma, Hongtao. author.

(1)

Mangioni, Giuseppe. editor.

(1)

Mathew, Joseph. editor.

(1)

Mazurkiewicz, Jacek. editor.

(1)

McCready, Eric (Eric S.), author.

(1)

Mineshima, Koji. editor.

(1)

Munsell, Brent. editor.

(1)

Murata, Tsuyoshi. editor.

(1)

Muruva, Hari Prasad. author.

(1)

Nakagawa, Toshio. author.

(1)

Natarajan, Dhanasekharan. author.

(1)

Nizamani, Zafarullah. author.

(1)

Nowakowski, Tomasz, editor.

(1)

Oivo, Markku. editor.

(1)

Oliver, Margaret A. author.

(1)

Olmi, Giorgio. author.

(1)

Ortuño, Francisco. editor.

(1)

Panigrahi, Bijaya Ketan. editor.

(1)

Pantazopoulou, Stavroula J. editor.

(1)

Papajorgji, Petraq. editor.

(1)

Papavassiliou, Symeon. editor.

(1)

Patelli, Edoardo. editor.

(1)

Pook, Leslie Philip. author.

(1)

Pragliola, Concetta. editor.

(1)

Prenat, Guillaume. editor.

(1)

Prinz, Andreas. editor.

(1)

Psycharis, Ioannis N. editor.

(1)

Périaux, Jacques. editor.

(1)

Qu, Shichun. author.

(1)

Randall, Marcus. editor.

(1)

Raouf, A. author.

(1)

Reis, Ricardo. editor.

(1)

Rojas, Ignacio. editor.

(1)

Rueckert, Daniel. editor.

(1)

Ruehrup, Stefan. editor.

(1)

Russo, Barbara. editor.

(1)

Saidi-Mehrabad, Mohammad. author.

(1)

Schewe, Klaus-Dieter. editor.

(1)

Selvaraj, Henry. editor.

(1)

Setola, Roberto. editor.

(1)

Sforza, Antonio. editor.

(1)

(1)

Simini, Filippo. editor.

(1)

Sobh, Tarek. editor.

(1)

Suresh, L. Padma. editor.

(1)

Thalheim, Bernhard. editor.

(1)

Träff, Jesper Larsson. editor.

(1)

Tse, Peter W. editor.

(1)

Tsokos, Chris P.

(1)

United States. Air Force. Office of Scientific Research.

(1)

University of South Florida.

(1)

Uzzo, Stephen Miles. editor.

(1)

Vaidyanathan, Sundarapandian. editor.

(1)

Varfolomeev, Serge¿̐ưi Dmitrievich, editor.

(1)

Verma, Ajit Kumar. author.

(1)

Versaci, Francesco. editor.

(1)

Vittorini, Valeria. editor.

(1)

Vujović, Igor. author.

(1)

Walkowiak, Tomasz. editor.

(1)

Wang, Dashun. editor.

(1)

Wang, Wego. editor.

(1)

Wang, Wen-fang. editor.

(1)

Webster, Richard. author.

(1)

Wee Sit, Evro. editor.

(1)

Winter, Gabriel. editor.

(1)

Wirth, Gilson. editor.

(1)

Wong, King. editor.

(1)

Wu, Guorong. editor.

(1)

Xhafa, Fatos. editor.

(1)

Xu, Dachuan. editor.

(1)

Yamamoto, Sakae. editor.

(1)

Yang, Gi-Chul. editor.

(1)

Yilmaz, Levent. editor.

(1)

Zhan, Yiqiang. editor.

(1)

Zhang, Chao. author.

(1)

Zhao, Weisheng. editor.

(1)

Zhao, Xufeng. author.

(1)

Zhu, Quanmin. editor.

(1)

Zomaya, Albert Y. editor.

(1)

Zydek, Dawid. editor.

(1)

van der Hoek, Wiebe. editor.

(1)

Language

(82)

Subject

Security Science and Technology.

(14)

Security systems.

(14)

Computational intelligence.

(10)

Electronic Circuits and Systems.

(9)

Electronic circuits.

(9)

Mechanics, Applied.

(7)

Artificial intelligence.

(6)

Applied Dynamical Systems.

(5)

(5)

Electronics and Microelectronics, Instrumentation.

(5)

(5)

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(5)

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(5)

Industrial engineering.

(5)

Machines, Tools, Processes.

(5)

(5)

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(5)

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(5)

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(5)

(5)

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(4)

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(4)

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(4)

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(4)

(3)

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(3)

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(3)

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(3)

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(3)

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(3)

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(3)

(3)

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(3)

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(3)

Operations research.

(3)

Optical materials.

(3)

(3)

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(3)

Signal, Speech and Image Processing.

(3)

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(3)

(3)

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(3)

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(3)

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(3)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

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(2)

(2)

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(2)

(2)

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(2)

(2)

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(2)

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(2)

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(2)

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(2)

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(2)

(2)

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(2)

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(2)

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(2)

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(1)

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(1)

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(1)

(1)

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(1)

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(1)

(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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(1)

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1.

Cover image for Reliability in pragmatics

Reliability in pragmatics

Reliability in pragmatics

Author

McCready, Eric (Eric S.), author.

Preferred Shelf Number

P99.4.P72 M445 2015

Format:

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2.

Cover image for Circuit Design for Reliability

Circuit Design for Reliability

Circuit Design for Reliability

Author

Reis, Ricardo. editor. Cao, Yu. editor. Wirth, Gilson. editor. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

https://doi.org/10.1007/978-1-4614-4078-9

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3.

Cover image for Introduction to Quality and Reliability Engineering

Introduction to Quality and Reliability Engineering

Introduction to Quality and Reliability Engineering

Author

Jiang, Renyan. author. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

https://doi.org/10.1007/978-3-662-47215-6

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4.

Cover image for Wire Ropes Tension, Endurance, Reliability

Wire Ropes Tension, Endurance, Reliability

Wire Ropes Tension, Endurance, Reliability

Author

Feyrer, Klaus. author. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

https://doi.org/10.1007/978-3-642-54996-0

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5.

Cover image for The theory and applications of reliability with emphasis on Bayesian and nonparametric methods

The theory and applications of reliability with emphasis on Bayesian and nonparametric methods

The theory and applications of reliability with emphasis on Bayesian and nonparametric methods

Author

Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida) Tsokos, Chris P. Shimi, I. N. United States. Air Force. Office of Scientific Research. University of South Florida.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780127021010

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6.

Cover image for Safety and reliability : methodology and applications : proceedings of the European Safety and Reliability Conference, Esrel 2014, Wroc¿̐ưaw, Poland, 14-18 September 2014

Safety and reliability : methodology and applications : proceedings of the European Safety and Reliability Conference, Esrel 2014, Wroc¿̐ưaw, Poland, 14-18 September 2014

Safety and reliability : methodology and applications : proceedings of the European Safety and Reliability Conference, Esrel 2014, Wroc¿̐ưaw, Poland, 14-18 September 2014

Author

European Safety and Reliability Conference (2014 : Wroc¿̐ưaw, Poland) Nowakowski, Tomasz, editor.

Preferred Shelf Number

ONLINE(356984.1)

Electronic Access

Distributed by publisher. Purchase or institutional license may be required for access.

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7.

Cover image for Chemical and biochemical technology : materials, processing, and reliability

Chemical and biochemical technology : materials, processing, and reliability

Chemical and biochemical technology : materials, processing, and reliability

Author

Varfolomeev, Serge¿̐ưi Dmitrievich, editor.

Preferred Shelf Number

ONLINE(356545.1)

Electronic Access

Distributed by publisher. Purchase or institutional license may be required for access.

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8.

Cover image for Semi-Markov processes : applications in system reliability and maintenance

Semi-Markov processes : applications in system reliability and maintenance

Semi-Markov processes : applications in system reliability and maintenance

Author

Grabski, Franciszek, author.

Preferred Shelf Number

ONLINE(355517.1)

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780128005187

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9.

Cover image for Maintenance Overtime Policies in Reliability Theory Models with Random Working Cycles

Maintenance Overtime Policies in Reliability Theory Models with Random Working Cycles

Maintenance Overtime Policies in Reliability Theory Models with Random Working Cycles

Author

Nakagawa, Toshio. author. Zhao, Xufeng. author. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

https://doi.org/10.1007/978-3-319-20813-8

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10.

Cover image for Reliability and Availability of Quality Control Based on Wavelet Computer Vision

Reliability and Availability of Quality Control Based on Wavelet Computer Vision

Reliability and Availability of Quality Control Based on Wavelet Computer Vision

Author

Kuzmanić, Ivica. author. Vujović, Igor. author. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

https://doi.org/10.1007/978-3-319-13317-1

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11.

Cover image for Computer Safety, Reliability, and Security 34th International Conference, SAFECOMP 2015, Delft, The Netherlands, September 23-25, 2015, Proceedings

Computer Safety, Reliability, and Security 34th International Conference, SAFECOMP 2015, Delft, The Netherlands, September 23-25, 2015, Proceedings

Computer Safety, Reliability, and Security 34th International Conference, SAFECOMP 2015, Delft, The Netherlands, September 23-25, 2015, Proceedings

Author

Koornneef, Floor. editor. van Gulijk, Coen. editor. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

https://doi.org/10.1007/978-3-319-24255-2

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12.

Cover image for Computer Safety, Reliability, and Security SAFECOMP 2015 Workshops, ASSURE, DECSoS. ISSE, ReSA4CI, and SASSUR, Delft, The Netherlands, September 22, 2015, Proceedings

Computer Safety, Reliability, and Security SAFECOMP 2015 Workshops, ASSURE, DECSoS. ISSE, ReSA4CI, and SASSUR, Delft, The Netherlands, September 22, 2015, Proceedings

Computer Safety, Reliability, and Security SAFECOMP 2015 Workshops, ASSURE, DECSoS. ISSE, ReSA4CI, and SASSUR, Delft, The Netherlands, September 22, 2015, Proceedings

Author

Koornneef, Floor. editor. van Gulijk, Coen. editor. SpringerLink (Online service)

Preferred Shelf Number

ONLINE

Electronic Access

https://doi.org/10.1007/978-3-319-24249-1

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