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1. 
Cover image for Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessment
Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessment
Author 
Modarres, M. (Mohammad), author. Amiri, Mehdi, author. Jackson, Christopher, 1979- author.
Preferred Shelf Number 
TA169.5
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692
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2. 
Cover image for Smart Cards, Tokens, Security and Applications
Smart Cards, Tokens, Security and Applications
Author 
Mayes, Keith. editor. Markantonakis, Konstantinos. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-50500-8
Format: 
Availability 
Online Library~1
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