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Publication Date: 2017

Author

El Hami, Abdelkhalak, author.

(3)

Radi, Bouchaïb, author.

(2)

Agarwal, Rakish, author.

(1)

Amiri, Mehdi, author.

(1)

Ashcraft, Howard W., Jr., author.

(1)

Atik, Enver, author

(1)

Bai, Qiang, author.

(1)

Bai, Yong, author.

(1)

Baiulescu, George E., author.

(1)

Bisi, Manjubala, author.

(1)

Bodie, Graham, editor.

(1)

(1)

Caroni, Chrysseis, author.

(1)

Chebel-Morello, Brigitte, author.

(1)

Chimitova, Ekaterina V., author.

(1)

Cicek, Volkan, author.

(1)

Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida)

(1)

Dishongh, Terrance J., author.

(1)

Feng, Yanjun, 1969- author.

(1)

Feyel, Philippe.

(1)

Fischer, Martin, 1960 July 11- author.

(1)

Freundlich, Alexandre, editor.

(1)

Fujita, Daisuke (Materials scientist), editor.

(1)

Garner, Sean M., author.

(1)

Gong, Jian, 1975- author.

(1)

Goyal, Neeraj Kumar, author.

(1)

Harlamov, Boris, author.

(1)

Hua, Gengxin, 1965- author.

(1)

Ibrahim, R. A., 1940- author.

(1)

Jackson, Christopher, 1979- author.

(1)

Javadpour, Sirus, author.

(1)

KHANNA, VINOD KUMAR.

(1)

Kaiser, Debra L., editor.

(1)

Khanzode, Atul, 1971- author.

(1)

Kharmanda, Ghias, author.

(1)

Khinast, Johannes, 1964- editor.

(1)

Kitai, Adrian, 1957- editor.

(1)

Kleinebudde, Peter, 1958- editor.

(1)

(1)

(1)

Magnago, Fernando H.

(1)

Mahajan, Rahul, author.

(1)

Mansfield, Elisabeth, (Research chemist), editor.

(1)

McCluskey, F. Patrick, author.

(1)

Modarres, M. (Mohammad), author.

(1)

Munz, Volker A., editor.

(1)

Nicod, Jean-Marc, author.

(1)

Nikulin, M. S. (Mikhail Stepanovich), author.

(1)

Owen, Christine, author.

(1)

Pecht, Michael, author.

(1)

Puers, R., editor.

(1)

Rantanen, Jukka, editor.

(1)

Reed, Dean P., author.

(1)

Reinders, Angèle, editor.

(1)

Ritter, Bernhard, 1973- editor.

(1)

Robinson, Dom, author.

(1)

Ruan, Weidong, 1989- author.

(1)

Sark, Wilfried van, editor.

(1)

(1)

Smythies, Yorick, 1917-1980, writer of notes.

(1)

Tahralı, Necati

(1)

Trifunović, Nemanja.

(1)

Tsokos, Chris P.

(1)

United States. Air Force. Office of Scientific Research.

(1)

University of South Florida.

(1)

Varnier, Christophe, author.

(1)

Verlinden, Pierre, editor.

(1)

Voorde, M. H. van de (Marcel H.), editor.

(1)

Wang, Jiacun, 1963- author.

(1)

Wittgenstein, Ludwig, 1889-1951, author.

(1)

Worthington, Debra L., editor.

(1)

Yang, Mengfei, author.

(1)

Çivi, Cem, author

(1)

Language

(35)

(1)

Subject

Electronic books.

(16)

TECHNOLOGY & ENGINEERING.

(5)

(4)

TECHNOLOGY & ENGINEERING -- Mechanical.

(4)

(3)

Internet Resources.

(3)

(3)

TECHNOLOGY & ENGINEERING -- Civil -- General.

(3)

TECHNOLOGY & ENGINEERING -- Engineering (General)

(3)

COMPUTERS -- Computer Literacy.

(2)

COMPUTERS -- Computer Science.

(2)

COMPUTERS -- Data Processing.

(2)

COMPUTERS -- General.

(2)

COMPUTERS -- Hardware -- General.

(2)

COMPUTERS -- Information Technology.

(2)

COMPUTERS -- Machine Theory.

(2)

COMPUTERS -- Reference.

(2)

(2)

MATHEMATICS -- Applied.

(2)

MATHEMATICS -- Probability & Statistics -- General.

(2)

(2)

Nanotechnologie.

(2)

(2)

Nanotechnology.

(2)

SCIENCE -- Chemistry -- Industrial & Technical.

(2)

TECHNOLOGY & ENGINEERING -- Reference.

(2)

(1)

(1)

Affichage par électroluminescence -- Matériaux.

(1)

Analyse de régression.

(1)

Analyse des défaillances (Ingénierie)

(1)

Analyse stochastique.

(1)

(1)

(1)

Atomic force microscopy

(1)

Atomic force microscopy.

(1)

BUSINESS & ECONOMICS -- Insurance -- Risk Assessment & Management.

(1)

BUSINESS & ECONOMICS -- Real Estate -- General.

(1)

Bayesian statistical decision theory -- Congresses.

(1)

Biomechanical Phenomena

(1)

(1)

(1)

(1)

(1)

Building -- Superintendence

(1)

Building -- Superintendence.

(1)

Cathodic protection

(1)

Cathodic protection -- Examinations, questions, etc.

(1)

Cathodic protection -- Handbooks, manuals, etc.

(1)

Cellules photovoltaïques.

(1)

Chemistry, Analytic -- Quality control.

(1)

(1)

Chi-square test

(1)

Chi-square test.

(1)

Compréhension de l'écoute (Psychologie)

(1)

Computer Communication Networks

(1)

Computer Engineering.

(1)

Computer networks

(1)

Computer networks -- Monitoring

(1)

Computer networks -- Monitoring.

(1)

Computer networks.

(1)

Computer software -- Reliability

(1)

Computer software -- Reliability.

(1)

Construction -- Direction des travaux.

(1)

Constructions -- Dynamique -- Modèles mathématiques.

(1)

Conversion photovoltaïque.

(1)

Corrosion and anti-corrosives

(1)

Corrosion and anti-corrosives -- Examinations, questions, etc.

(1)

Corrosion and anti-corrosives -- Handbooks, manuals, etc.

(1)

Couches minces.

(1)

Drug Compounding -- methods

(1)

(1)

Durée de vie (Ingénierie)

(1)

Electric industries

(1)

Electric industries.

(1)

Electric lamps -- Materials.

(1)

Electric lighting.

(1)

Electric utilities

(1)

Electric utilities.

(1)

Electrical engineering -- Safety measures.

(1)

Electroluminescent display systems -- Materials.

(1)

Electromagnetics & Microwaves

(1)

Electronic Packaging

(1)

(1)

Embedded computer systems

(1)

Embedded computer systems.

(1)

Emergency management -- Australia.

(1)

(1)

FAMILY & RELATIONSHIPS.

(1)

Failure analysis (Engineering)

(1)

Fault-tolerant computing

(1)

Fault-tolerant computing.

(1)

(1)

Fire fighters -- Job stress -- Australia.

(1)

Fire management -- Australia.

(1)

First responders -- Job stress -- Australia.

(1)

Fluid-structure interaction

(1)

Fluid-structure interaction.

(1)

(1)

Fotovoltaikanlage

(1)

Fracture mechanics

(1)

Fracture mechanics.

(1)

Gestion de projet.

(1)

Gestion du risque -- Modèles mathématiques.

(1)

(1)

Glass coatings.

(1)

Guides et manuels.

(1)

Handbooks and manuals

(1)

Handbooks and manuals.

(1)

Heuristic programming

(1)

Heuristic programming.

(1)

Human engineering.

(1)

Industrial & Technical.

(1)

Industrie pharmaceutique.

(1)

Industries électriques.

(1)

Information display systems -- Materials.

(1)

Interaction fluide-structure.

(1)

Interconnexion de réseaux (Télécommunications)

(1)

Internetworking (Telecommunication)

(1)

Inverse problems (Differential equations)

(1)

Knowledge, Theory of

(1)

Knowledge, Theory of.

(1)

LED lighting -- Materials.

(1)

Light emitting diodes.

(1)

(1)

Listening comprehension

(1)

Listening comprehension.

(1)

(1)

Logiciels -- Fiabilité.

(1)

MEDICAL -- Pharmacology.

(1)

Machine design -- Reliability.

(1)

Machine parts -- Reliability.

(1)

Makine elemanları -- Güvenilirlik.

(1)

Makine tasarımı -- Güvenilirlik .

(1)

Materials -- Fatigue

(1)

Materials -- Fatigue.

(1)

Materials Science.

(1)

Mathematical Analysis.

(1)

Mathematical optimization

(1)

Mathematical optimization.

(1)

Matériaux -- Fatigue.

(1)

(1)

(1)

(1)

Microelectronics.

(1)

Microscopie à force atomique.

(1)

Mécanique de la rupture.

(1)

(1)

Nanoelectronics

(1)

Nanoelectronics.

(1)

Nanoélectronique.

(1)

(1)

Neural Networks, Computer

(1)

Neural networks (Computer science)

(1)

Optimisation mathématique.

(1)

Organic semiconductors.

(1)

PHILOSOPHY -- Epistemology.

(1)

Pharmaceutical industry

(1)

Pharmaceutical industry.

(1)

Pharmaceutical technology

(1)

Pharmaceutical technology.

(1)

Photovoltaic cells

(1)

Photovoltaic cells.

(1)

Photovoltaic power generation

(1)

Photovoltaic power generation.

(1)

Pipe -- Materials.

(1)

Pipelines -- Design and construction

(1)

Pipelines -- Design and construction.

(1)

Problèmes inverses (Équations différentielles)

(1)

Processus stochastiques.

(1)

Programmation heuristique.

(1)

Project management

(1)

Project management.

(1)

Protection cathodique -- Examens, questions, etc.

(1)

Protection cathodique -- Guides, manuels, etc.

(1)

Quality Control.

(1)

Railroads -- Safety measures.

(1)

Real-time data processing

(1)

Real-time data processing.

(1)

(1)

Regression analysis

(1)

Regression analysis.

(1)

Reliability (Engineering)

(1)

Reliability (Engineering) -- Mathematical models -- Congresses.

(1)

Risk management -- Mathematical models

(1)

Risk management -- Mathematical models.

(1)

Réseaux d'ordinateurs -- Surveillance.

(1)

Réseaux d'ordinateurs.

(1)

Réseaux neuronaux (Informatique)

(1)

SCIENCE -- Life Sciences -- Anatomy & Physiology.

(1)

Semi-conducteurs -- Matériaux.

(1)

Semiconductors -- Materials

(1)

Semiconductors -- Materials.

(1)

Service life (Engineering)

(1)

Services publics d'électricité.

(1)

(1)

(1)

Space vehicles -- Command control systems

(1)

Space vehicles -- Command control systems.

(1)

Space vehicles -- Control systems

(1)

Material Type

Shelf Location

Beytepe General Collection

Electronic Library

Wiley E-Book Collection

Library

Beytepe Library

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1.

Cover image for Biomechanics : optimization, uncertainties and reliability

Biomechanics : optimization, uncertainties and reliability

Biomechanics : optimization, uncertainties and reliability

Author

Kharmanda, Ghias, author. El Hami, Abdelkhalak, author.

Preferred Shelf Number

QH513

Electronic Access

https://onlinelibrary.wiley.com/doi/book/10.1002/9781119379126

Format:

Availability

Online Library~1

Available:
Copies:

2.

Cover image for Quality and Reliability in Analytical Chemistry.

Quality and Reliability in Analytical Chemistry.

Quality and Reliability in Analytical Chemistry.

Author

Baiulescu, George E., author.

Preferred Shelf Number

QD75.4 .Q34

Electronic Access

Taylor & Francis https://www.taylorfrancis.com/books/e/9781420038576
Taylor & Francis https://www.taylorfrancis.com/books/e/9780429127441
Taylor & Francis https://www.taylorfrancis.com/books/9780429127441
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf

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3.

Cover image for Artificial neural network for software reliability prediction

Artificial neural network for software reliability prediction

Artificial neural network for software reliability prediction

Author

Bisi, Manjubala, author. Goyal, Neeraj Kumar, author.

Preferred Shelf Number

QA76.87

Electronic Access

https://onlinelibrary.wiley.com/doi/book/10.1002/9781119223931

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4.

Cover image for The theory and applications of reliability with emphasis on Bayesian and nonparametric methods

The theory and applications of reliability with emphasis on Bayesian and nonparametric methods

The theory and applications of reliability with emphasis on Bayesian and nonparametric methods

Author

Conference on the Theory and Applications of Reliability with Emphasis on Bayesian and Nonparametric Methods (1975 : University of South Florida) Tsokos, Chris P. Shimi, I. N. United States. Air Force. Office of Scientific Research. University of South Florida.

Preferred Shelf Number

ONLINE

Electronic Access

ScienceDirect http://www.sciencedirect.com/science/book/9780127021010

Format:

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5.

Cover image for Pattern recognition for reliability assessment of water distribution networks

Pattern recognition for reliability assessment of water distribution networks

Pattern recognition for reliability assessment of water distribution networks

Author

Trifunović, Nemanja. CRC Press LLC.

Preferred Shelf Number

TD481

Electronic Access

Taylor & Francis https://www.taylorfrancis.com/books/9780429097645
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf

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6.

Cover image for Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessment

Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessment

Probabilistic physics of failure approach to reliability : modeling, accelerated testing, prognosis and reliability assessment

Author

Modarres, M. (Mohammad), author. Amiri, Mehdi, author. Jackson, Christopher, 1979- author.

Preferred Shelf Number

TA169.5

Electronic Access

https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388692

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7.

Cover image for Konstrüksiyon elemanlarında güvenirlik (reliability) ve ömür hesapları ; teorik açıklamalar ve uygulamalar

Konstrüksiyon elemanlarında güvenirlik (reliability) ve ömür hesapları ; teorik açıklamalar ve uygulamalar

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Author

Tahralı, Necati Atik, Enver, author Çivi, Cem, author

Preferred Shelf Number

TJ230 T34 2017

Format:

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Beytepe Library~1

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8.

Cover image for RAIL HUMAN FACTORS : supporting reliability, safety and cost reduction.

RAIL HUMAN FACTORS : supporting reliability, safety and cost reduction.

RAIL HUMAN FACTORS : supporting reliability, safety and cost reduction.

Preferred Shelf Number

TF610

Electronic Access

Taylor & Francis https://www.taylorfrancis.com/books/9780429212598
OCLC metadata license agreement http://www.oclc.org/content/dam/oclc/forms/terms/vbrl-201703.pdf

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9.

Cover image for From prognostics and health systems management to predictive maintenance 2 : knowledge, traceability and decision

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From prognostics and health systems management to predictive maintenance 2 : knowledge, traceability and decision

Author

Chebel-Morello, Brigitte, author. Nicod, Jean-Marc, author. Varnier, Christophe, author.

Preferred Shelf Number

TK5105.5

Electronic Access

https://onlinelibrary.wiley.com/doi/book/10.1002/9781119436805

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10.

Cover image for First hitting time regression models : lifetime data analysis based on underlying stochastic processes

First hitting time regression models : lifetime data analysis based on underlying stochastic processes

First hitting time regression models : lifetime data analysis based on underlying stochastic processes

Author

Caroni, Chrysseis, author.

Preferred Shelf Number

QA278.2

Electronic Access

https://onlinelibrary.wiley.com/doi/book/10.1002/9781119437260

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11.

Cover image for Stochastic risk analysis and management

Stochastic risk analysis and management

Stochastic risk analysis and management

Author

Harlamov, Boris, author.

Preferred Shelf Number

HD61

Electronic Access

https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388883

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12.

Cover image for Fluid-structure interactions and uncertainties : Ansys and fluent tools

Fluid-structure interactions and uncertainties : Ansys and fluent tools

Fluid-structure interactions and uncertainties : Ansys and fluent tools

Author

El Hami, Abdelkhalak, author. Radi, Bouchaïb, author.

Preferred Shelf Number

TA357.5 .F58 E44 2017 EB

Electronic Access

https://onlinelibrary.wiley.com/doi/book/10.1002/9781119388937

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