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Cover image for VLSI-SoC: System-on-Chip in the Nanoscale Era - Design, Verification and Reliability 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016, Revised Selected Papers
VLSI-SoC: System-on-Chip in the Nanoscale Era - Design, Verification and Reliability 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016, Revised Selected Papers
Author 
Hollstein, Thomas. editor. Raik, Jaan. editor. Kostin, Sergei. editor. Tšertov, Anton. editor. O'Connor, Ian. editor.
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https://doi.org/10.1007/978-3-319-67104-8
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2. 
Cover image for Advanced Digital System Design A Practical Guide to Verilog Based FPGA and ASIC Implementation
Advanced Digital System Design A Practical Guide to Verilog Based FPGA and ASIC Implementation
Author 
Roy, Shirshendu. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-41085-7
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3. 
Cover image for FPGA EDA Design Principles and Implementation
FPGA EDA Design Principles and Implementation
Author 
Tu, Kaihui. author. Tang, Xifan. author. Yu, Cunxi. author. (orcid)0000-0003-3481-307X Josipović, Lana. author. Chu, Zhufei. author. (orcid)0000-0001-5718-4822
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https://doi.org/10.1007/978-981-99-7755-0
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4. 
Cover image for Advances in VLSI and Embedded Systems Select Proceedings of AVES 2021
Advances in VLSI and Embedded Systems Select Proceedings of AVES 2021
Author 
Darji, Anand D. editor. Joshi, Deepak. editor. Joshi, Amit. editor. Sheriff, Ray. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-19-6780-1
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5. 
Cover image for VLSI-SoC: Design for Reliability, Security, and Low Power 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers
VLSI-SoC: Design for Reliability, Security, and Low Power 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers
Author 
Shin, Youngsoo. editor. Tsui, Chi Ying. editor. Kim, Jae-Joon. editor. Choi, Kiyoung. editor. Reis, Ricardo. editor. (orcid)0000-0001-5781-5858
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Electronic Access 
https://doi.org/10.1007/978-3-319-46097-0
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6. 
Cover image for Circuit Design for Reliability
Circuit Design for Reliability
Author 
Reis, Ricardo. editor. Cao, Yu. editor. Wirth, Gilson. editor. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-1-4614-4078-9
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