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1. 
Cover image for Reliability prediction and testing textbook
Reliability prediction and testing textbook
Author 
Klyatis, Lev M., author. Anderson, Edward, 1945- author.
Preferred Shelf Number 
TA169.3 .K5964 2018
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119411949
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2. 
Cover image for Accelerated reliability and durability testing technology
Accelerated reliability and durability testing technology
Author 
Klyatis, Lev M.
Preferred Shelf Number 
ONLINE
Electronic Access 
Wiley InterScience An electronic book accessible through the World Wide Web; click for information
ebrary http://site.ebrary.com/id/10592157
http://swb.eblib.com/patron/FullRecord.aspx?p=693204
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3. 
Cover image for High Voltage Engineering and Testing
High Voltage Engineering and Testing
Author 
Ryan, Hugh M., ed.
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1049/PBPO032E
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4. 
Cover image for Accelerated life testing of one-shot devices : data collection and analysis
Accelerated life testing of one-shot devices : data collection and analysis
Author 
Balakrishnan, N., 1956- author. Ling, Man Ho, author. So, Hon Yiu, author.
Preferred Shelf Number 
TA169.3 .B35 2021
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119664031
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5. 
Cover image for Accelerated testing and validation testing, engineering, and management tools for lean development
Accelerated testing and validation testing, engineering, and management tools for lean development
Author 
Porter, Alex.
Preferred Shelf Number 
ONLINE
Electronic Access 
Volltext http://www.sciencedirect.com/science/book/9780750676533
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6. 
Cover image for Accelerated quality and reliability solutions
Accelerated quality and reliability solutions
Author 
Klyatis, Lev M. Klyatis, Eugene L.
Preferred Shelf Number 
ONLINE
Electronic Access 
ScienceDirect http://www.sciencedirect.com/science/book/9780080449241
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7. 
Cover image for Design and analysis of accelerated tests for mission critical reliability
Design and analysis of accelerated tests for mission critical reliability
Author 
LuValle, Michael J., author. Lefevre, Bruce G. Kannan, SriRaman.
Preferred Shelf Number 
TA169.3 .L88 2004
Electronic Access 
Click here to view.
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