Cover image for Measurement and modeling of silicon heterostructure devices
Title:
Measurement and modeling of silicon heterostructure devices
Author:
Cressler, John D.
ISBN:
9781420066937

9781315218878

9781351826075
Physical Description:
1 online resource (200 pages)
Contents:
chapter 001 Best-Practice AC Measurement Techniques. 4- -- chapter 002 A Brief History of the Field -- chapter 003 Overview: Measurement and Modeling -- chapter 004 Best-Practice AC Measurement Techniques -- chapter 005 Industrial Application of TCAD for SiGe Development -- chapter 006 Compact Modeling of SiGe HBTs: HICUM -- chapter 007 Compact Modeling of SiGe HBTs: Mextram -- chapter 008 CAD Tools and Design Kits -- chapter 009 Parasitic Modeling and Noise Mitigation Approaches in Silicon Germanium RF Designs -- chapter 010 Transmission Lines on Si -- chapter 011 Improved De-Embedding Techniques.
Subject Term:
Bipolar transistors -- Mathematical models.

Bipolar transistors.

Heterostructures.

Integrated circuits -- Design and construction.
Added Author:
Cressler, John D.
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 E-Book 540479-1001 TK7871.96 .B55 M33 2008
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