Cover image for Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings
Title:
Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006. Proceedings
Author:
Yeung, Dit-Yan. editor.
ISBN:
9783540372417
Physical Description:
XXI, 939 p. Also available online. online resource.
Series:
Lecture Notes in Computer Science, 4109
Series Title:
Lecture Notes in Computer Science, 0302-9743 ; 4109
Subject Term:
Computer science.

Computational complexity.

Artificial intelligence.

Computer graphics.

Computer vision.

Optical pattern recognition.
Added Author:
Kwok, James T.

Fred, Ana.

Roli, Fabio.

Ridder, Dick.
Added Corporate Author:
SpringerLink (Online service)
Electronic Access:
http://dx.doi.org/10.1007/11815921
Holds:

Copies:

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