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1. 
Cover image for Thermal and Power Management of Integrated Circuits
Thermal and Power Management of Integrated Circuits
Author 
Vassighi, Arman. author. Sachdev, Manoj. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/0-387-29749-9
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2. 
Cover image for Reuse-Based Methodologies and Tools in the Design of Analog and Mixed-Signal Integrated Circuits
Reuse-Based Methodologies and Tools in the Design of Analog and Mixed-Signal Integrated Circuits
Author 
CASTRO-LÓPEZ, R. author. FERNÁNDEZ, F.V. author. GUERRA-VINUESA, O. author. RODRÍGUEZ-VÁZQUEZ, Á. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-5139-5
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3. 
Cover image for Electromagnetic Compatibility of Integrated Circuits Techniques for low emission and susceptibility
Electromagnetic Compatibility of Integrated Circuits Techniques for low emission and susceptibility
Author 
Ben Dhia, Sonia. editor. Ramdani, Mohamed. editor. Sicard, Etienne. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b137864
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4. 
Cover image for Nanoscale Memory Repair
Nanoscale Memory Repair
Author 
Horiguchi, Masashi. author. Itoh, Kiyoo. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-7958-2
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5. 
Cover image for Carbon Nanotube Electronics
Carbon Nanotube Electronics
Author 
Kong, Jing. editor. Javey, Ali. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-69285-2
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6. 
Cover image for Clocking in Modern VLSI Systems
Clocking in Modern VLSI Systems
Author 
Xanthopoulos, Thucydides. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4419-0261-0
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7. 
Cover image for Routing Congestion in VLSI Circuits: Estimation and Optimization
Routing Congestion in VLSI Circuits: Estimation and Optimization
Author 
Saxena, Prashant. author. Shelar, Rupesh S. author. Sapatnekar, Sachin S. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-48550-3
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8. 
Cover image for Design for Manufacturability and Yield for Nano-Scale CMOS
Design for Manufacturability and Yield for Nano-Scale CMOS
Author 
Chiang, Charles C. author. Kawa, Jamil. author. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-5188-3
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9. 
Cover image for SAT-Based Scalable Formal Verification Solutions
SAT-Based Scalable Formal Verification Solutions
Author 
Ganai, Malay K. author. Gupta, Aarti. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-387-69167-1
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10. 
Cover image for Leakage in Nanometer CMOS Technologies
Leakage in Nanometer CMOS Technologies
Author 
Narendra, Siva G. author. Chandrakasan, Anantha. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/0-387-28133-9
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11. 
Cover image for Abstraction Refinement for Large Scale Model Checking
Abstraction Refinement for Large Scale Model Checking
Author 
Wang, Chao. author. Hachtel, Gary D. author. Somenzi, Fabio. author. SpringerLink (Online service)
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ONLINE
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http://dx.doi.org/10.1007/0-387-34600-7
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12. 
Cover image for A Practical Introduction to PSL
A Practical Introduction to PSL
Author 
Eisner, Cindy. author. Fisman, Dana. author. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/978-0-387-36123-9
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