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Cover image for Modeling for reliability analysis Markov modeling for reliability, maintainability, safety, and supportability analyses of complex computer systems
Modeling for reliability analysis Markov modeling for reliability, maintainability, safety, and supportability analyses of complex computer systems
Author 
Pukite, Jan, 1928- Pukite, Paul.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263338
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2. 
Cover image for Computer Safety, Reliability, and Security 36th International Conference, SAFECOMP 2017, Trento, Italy, September 13-15, 2017, Proceedings
Computer Safety, Reliability, and Security 36th International Conference, SAFECOMP 2017, Trento, Italy, September 13-15, 2017, Proceedings
Author 
Tonetta, Stefano. editor. Schoitsch, Erwin. editor. Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121 SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-3-319-66266-4
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3. 
Cover image for Computer Safety, Reliability, and Security SAFECOMP 2017 Workshops, ASSURE, DECSoS, SASSUR, TELERISE, and TIPS, Trento, Italy, September 12, 2017, Proceedings
Computer Safety, Reliability, and Security SAFECOMP 2017 Workshops, ASSURE, DECSoS, SASSUR, TELERISE, and TIPS, Trento, Italy, September 12, 2017, Proceedings
Author 
Tonetta, Stefano. editor. Schoitsch, Erwin. editor. Bitsch, Friedemann. editor. (orcid)0000-0001-6152-4121 SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-66284-8
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4. 
Cover image for Computers, Software Engineering, and Digital Devices
Computers, Software Engineering, and Digital Devices
Author 
Dorf, Richard C., author. Taylor and Francis.
Preferred Shelf Number 
TK7885
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