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Cover image for VLSI-SoC 2023: Innovations for Trustworthy Artificial Intelligence 31st IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2023, Sharjah, United Arab Emirates, October 16-18, 2023, Revised Extended Selected Papers
VLSI-SoC 2023: Innovations for Trustworthy Artificial Intelligence 31st IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2023, Sharjah, United Arab Emirates, October 16-18, 2023, Revised Extended Selected Papers
Author 
Elfadel, Ibrahim (Abe) M. editor. (orcid)0000-0003-3220-9987 Albasha, Lutfi. editor. (orcid)0000-0001-5933-0280 SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-70947-0
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Cover image for VLSI-SoC: System-on-Chip in the Nanoscale Era - Design, Verification and Reliability 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016, Revised Selected Papers
VLSI-SoC: System-on-Chip in the Nanoscale Era - Design, Verification and Reliability 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016, Revised Selected Papers
Author 
Hollstein, Thomas. editor. Raik, Jaan. editor. Kostin, Sergei. editor. Tšertov, Anton. editor. O'Connor, Ian. editor.
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https://doi.org/10.1007/978-3-319-67104-8
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3. 
Cover image for VLSI-SoC: Design for Reliability, Security, and Low Power 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers
VLSI-SoC: Design for Reliability, Security, and Low Power 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers
Author 
Shin, Youngsoo. editor. Tsui, Chi Ying. editor. Kim, Jae-Joon. editor. Choi, Kiyoung. editor. Reis, Ricardo. editor. (orcid)0000-0001-5781-5858
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https://doi.org/10.1007/978-3-319-46097-0
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4. 
Cover image for Modeling for reliability analysis Markov modeling for reliability, maintainability, safety, and supportability analyses of complex computer systems
Modeling for reliability analysis Markov modeling for reliability, maintainability, safety, and supportability analyses of complex computer systems
Author 
Pukite, Jan, 1928- Pukite, Paul.
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263338
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Cover image for Security, Privacy, and Anonymity in Computation, Communication, and Storage SpaCCS 2017 International Workshops, Guangzhou, China, December 12-15, 2017, Proceedings
Security, Privacy, and Anonymity in Computation, Communication, and Storage SpaCCS 2017 International Workshops, Guangzhou, China, December 12-15, 2017, Proceedings
Author 
Wang, Guojun. editor. (orcid)0000-0001-9875-4182 Atiquzzaman, Mohammed. editor. Yan, Zheng. editor. Choo, Kim-Kwang Raymond. editor. (orcid)0000-0001-9208-5336 SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-72395-2
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6. 
Cover image for Computer, network, software, and hardware engineering with applications
Computer, network, software, and hardware engineering with applications
Author 
Schneidewind, Norman.
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IEEEXplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6168884
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