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1. 
Cover image for Test und Verlässlichkeit von Rechnern
Test und Verlässlichkeit von Rechnern
Author 
Kemnitz, Günter. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-71355-5
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2. 
Cover image for Integrated Circuit Test Engineering Modern Techniques
Integrated Circuit Test Engineering Modern Techniques
Author 
Grout, Ian A. author. SpringerLink (Online service)
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Electronic Access 
http://dx.doi.org/10.1007/1-84628-173-3
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3. 
Cover image for VLSI Design and Test 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers
VLSI Design and Test 22nd International Symposium, VDAT 2018, Madurai, India, June 28-30, 2018, Revised Selected Papers
Author 
Rajaram, S. editor. Balamurugan, N.B. editor. Gracia Nirmala Rani, D. editor. Singh, Virendra. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-13-5950-7
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4. 
Cover image for VLSI Design and Test 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers
VLSI Design and Test 23rd International Symposium, VDAT 2019, Indore, India, July 4–6, 2019, Revised Selected Papers
Author 
Sengupta, Anirban. editor. Dasgupta, Sudeb. editor. Singh, Virendra. editor. Sharma, Rohit. editor. Kumar Vishvakarma, Santosh. editor.
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-32-9767-8
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5. 
Cover image for VLSI Design and Test 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers
VLSI Design and Test 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers
Author 
Gaur, Manoj Singh. editor. Zwolinski, Mark. editor. Laxmi, Vijay. editor. Boolchandani, Dharmendra. editor. Sing, Virendra. editor.
Preferred Shelf Number 
ONLINE(335156.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-42024-5
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6. 
Cover image for Design, Analysis and Test of Logic Circuits Under Uncertainty
Design, Analysis and Test of Logic Circuits Under Uncertainty
Author 
Krishnaswamy, Smita. author. Markov, Igor L. author. Hayes, John P. author. SpringerLink (Online service)
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ONLINE(335669.1)
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http://dx.doi.org/10.1007/978-90-481-9644-9
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7. 
Cover image for Design, Automation, and Test in Europe The Most Influential Papers of 10 Years Date
Design, Automation, and Test in Europe The Most Influential Papers of 10 Years Date
Author 
Lauwereins, Rudy. editor. Madsen, Jan. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-6488-3
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8. 
Cover image for System-level Test and Validation of Hardware/Software Systems
System-level Test and Validation of Hardware/Software Systems
Author 
Sonza Reorda, Matteo. editor. Peng, Zebo. editor. Violante, Massimo. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/1-84628-145-8
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