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1. 
Cover image for Test und Verlässlichkeit von Rechnern
Test und Verlässlichkeit von Rechnern
Author 
Kemnitz, Günter. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-3-540-71355-5
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2. 
Cover image for Test and Analysis of Web Services
Test and Analysis of Web Services
Author 
Baresi, Luciano. editor. Nitto, Elisabetta Di. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-540-72912-9
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3. 
Cover image for Design Driven Testing Test Smarter, Not Harder
Design Driven Testing Test Smarter, Not Harder
Author 
Stephens, Matt. author. Rosenberg, Doug. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4302-2944-5
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4. 
Cover image for Design, Analysis and Test of Logic Circuits Under Uncertainty
Design, Analysis and Test of Logic Circuits Under Uncertainty
Author 
Krishnaswamy, Smita. author. Markov, Igor L. author. Hayes, John P. author. SpringerLink (Online service)
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ONLINE(335669.1)
Electronic Access 
http://dx.doi.org/10.1007/978-90-481-9644-9
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5. 
Cover image for System-Level Validation High-Level Modeling and Directed Test Generation Techniques
System-Level Validation High-Level Modeling and Directed Test Generation Techniques
Author 
Chen, Mingsong. author. Qin, Xiaoke. author. Koo, Heon-Mo. author. Mishra, Prabhat. author. SpringerLink (Online service)
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ONLINE(331265.1)
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http://dx.doi.org/10.1007/978-1-4614-1359-2
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6. 
Cover image for Qualitätssicherung durch Softwaretests Vorgehensweisen und Werkzeuge zum Test von Java-Programmen
Qualitätssicherung durch Softwaretests Vorgehensweisen und Werkzeuge zum Test von Java-Programmen
Author 
Kleuker, Stephan. author. SpringerLink (Online service)
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ONLINE(338309.1)
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http://dx.doi.org/10.1007/978-3-8348-2068-6
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7. 
Cover image for VLSI Design and Test 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers
VLSI Design and Test 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Revised Selected Papers
Author 
Gaur, Manoj Singh. editor. Zwolinski, Mark. editor. Laxmi, Vijay. editor. Boolchandani, Dharmendra. editor. Sing, Virendra. editor.
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ONLINE(335156.1)
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http://dx.doi.org/10.1007/978-3-642-42024-5
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8. 
Cover image for Progress in VLSI Design and Test 16th International Symposium, VDAT 2012, Shibpur, India, July 1-4, 2012. Proceedings
Progress in VLSI Design and Test 16th International Symposium, VDAT 2012, Shibpur, India, July 1-4, 2012. Proceedings
Author 
Rahaman, Hafizur. editor. Chattopadhyay, Sanatan. editor. Chattopadhyay, Santanu. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-642-31494-0
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9. 
Cover image for High Quality Test Pattern Generation and Boolean Satisfiability
High Quality Test Pattern Generation and Boolean Satisfiability
Author 
Eggersglüß, Stephan. author. Drechsler, Rolf. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-9976-4
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10. 
Cover image for Efficient Test Methodologies for High-Speed Serial Links
Efficient Test Methodologies for High-Speed Serial Links
Author 
Hong, Dongwoo. author. Cheng, Kwang-Ting. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-90-481-3443-4
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11. 
Cover image for Test-Driven Development An Empirical Evaluation of Agile Practice
Test-Driven Development An Empirical Evaluation of Agile Practice
Author 
Madeyski, Lech. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-3-642-04288-1
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12. 
Cover image for Parsing the Turing Test Philosophical and Methodological Issues in the Quest for the Thinking Computer
Parsing the Turing Test Philosophical and Methodological Issues in the Quest for the Thinking Computer
Author 
Epstein, Robert. editor. Roberts, Gary. editor. Beber, Grace. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4020-6710-5
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