Cover image for Test Generation of Crosstalk Delay Faults in VLSI Circuits
Title:
Test Generation of Crosstalk Delay Faults in VLSI Circuits
Author:
Jayanthy, S. author.
ISBN:
9789811324932
Edition:
1st ed. 2019.
Physical Description:
XI, 156 p. 49 illus., 7 illus. in color. online resource.
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