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1. 
Cover image for Interconnect Reliability in Advanced Memory Device Packaging
Interconnect Reliability in Advanced Memory Device Packaging
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Gan, Chong Leong,. author. Huang, Chen-Yu,. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-26708-6
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Cover image for Which-Is-Better (WIB): Problems in Reliability Theory
Which-Is-Better (WIB): Problems in Reliability Theory
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Mizutani, Satoshi. author. Zhao, Xufeng. author. Nakagawa, Toshio. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-27316-2
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Cover image for Applications in Reliability and Statistical Computing
Applications in Reliability and Statistical Computing
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Pham, Hoang. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-21232-1
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Cover image for Autonomous driving algorithms and Its IC Design
Autonomous driving algorithms and Its IC Design
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Ren, Jianfeng. author. Xia, Dong. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-99-2897-2
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Cover image for International Conference on Reliable Systems Engineering (ICoRSE) - 2022
International Conference on Reliable Systems Engineering (ICoRSE) - 2022
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Cioboată, Daniela Doina. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-15944-2
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Cover image for Optimal Inspection Models with Their Applications
Optimal Inspection Models with Their Applications
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Ito, Kodo. author. Nakagawa, Toshio. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-22021-0
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Cover image for Herkes için bilgisayara giriş
Herkes için bilgisayara giriş
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Koç, Ayşegül.
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QA76 K63 2023
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Cover image for Risk-Conscious Operations Management An Integrated Paradigm for Complex Engineering System
Risk-Conscious Operations Management An Integrated Paradigm for Complex Engineering System
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Varde, Prabhakar V. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-19-9334-3
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Cover image for Advances in Reliability and Safety Assessment for Critical Systems Proceedings of the 5th National Conference on Reliability and Safety (NCRS 2022)
Advances in Reliability and Safety Assessment for Critical Systems Proceedings of the 5th National Conference on Reliability and Safety (NCRS 2022)
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Senthil Kumar, C. editor. Sujatha, R. editor. Muthukumar, R. editor. Rao, K. Balaji. editor. Prakash, Raghu V. editor.
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https://doi.org/10.1007/978-981-99-5049-2
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Cover image for Bilgisayar mühendisliğine giriş
Bilgisayar mühendisliğine giriş
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Çölkesen, Toros Rifat. Eren, Şaban.
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QA76.27 B552 2022
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Cover image for Yapay zeka çağı : dördüncü çağ: akıllı robotlar, bilinçaltı bilgisayarlar ve insanlığın geleceği
Yapay zeka çağı : dördüncü çağ: akıllı robotlar, bilinçaltı bilgisayarlar ve insanlığın geleceği
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Reese, Byron. Doğan, Mihriban.
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Q335 R4519 2020
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Cover image for Security and Privacy Second ISEA International Conference, ISEA-ISAP 2018, Jaipur, India, January, 9–11, 2019, Revised Selected Papers
Security and Privacy Second ISEA International Conference, ISEA-ISAP 2018, Jaipur, India, January, 9–11, 2019, Revised Selected Papers
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Nandi, Sukumar. editor. Jinwala, Devesh. editor. Singh, Virendra. editor. Laxmi, Vijay. editor. Gaur, Manoj Singh. editor.
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https://doi.org/10.1007/978-981-13-7561-3
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