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1. 
Cover image for VLSI-SoC 2023: Innovations for Trustworthy Artificial Intelligence 31st IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2023, Sharjah, United Arab Emirates, October 16-18, 2023, Revised Extended Selected Papers
VLSI-SoC 2023: Innovations for Trustworthy Artificial Intelligence 31st IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2023, Sharjah, United Arab Emirates, October 16-18, 2023, Revised Extended Selected Papers
Author 
Elfadel, Ibrahim (Abe) M. editor. (orcid)0000-0003-3220-9987 Albasha, Lutfi. editor. (orcid)0000-0001-5933-0280 SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-70947-0
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Cover image for VLSI-SoC: System-on-Chip in the Nanoscale Era - Design, Verification and Reliability 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016, Revised Selected Papers
VLSI-SoC: System-on-Chip in the Nanoscale Era - Design, Verification and Reliability 24th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2016, Tallinn, Estonia, September 26-28, 2016, Revised Selected Papers
Author 
Hollstein, Thomas. editor. Raik, Jaan. editor. Kostin, Sergei. editor. Tšertov, Anton. editor. O'Connor, Ian. editor.
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https://doi.org/10.1007/978-3-319-67104-8
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3. 
Cover image for VLSI-SoC: Design for Reliability, Security, and Low Power 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers
VLSI-SoC: Design for Reliability, Security, and Low Power 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers
Author 
Shin, Youngsoo. editor. Tsui, Chi Ying. editor. Kim, Jae-Joon. editor. Choi, Kiyoung. editor. Reis, Ricardo. editor. (orcid)0000-0001-5781-5858
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https://doi.org/10.1007/978-3-319-46097-0
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4. 
Cover image for Quantum computing explained
Quantum computing explained
Author 
McMahon, David (David M.)
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Click for information
Click here to view book
Available by subscription from Safari Books Online
John Wiley http://dx.doi.org/10.1002/9780470181386
MyiLibrary, Table of contents http://www.myilibrary.com?id=122156&ref=toc
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5. 
Cover image for The second self computers and the human spirit
The second self computers and the human spirit
Author 
Turkle, Sherry.
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267347
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6. 
Cover image for The Turing test verbal behavior as the hallmark of intelligence
The Turing test verbal behavior as the hallmark of intelligence
Author 
Shieber, Stuart M.
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267336
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7. 
Cover image for Ethics and computing living responsibly in a computerized world
Ethics and computing living responsibly in a computerized world
Author 
Bowyer, Kevin, 1955-
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5264741
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8. 
Cover image for The first computers history and architectures
The first computers history and architectures
Author 
Rojas, Raúl, 1955- Hashagen, Ulf.
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276817
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9. 
Cover image for Humour the computer
Humour the computer
Author 
Davison, Andrew.
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267510
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10. 
Cover image for Digital mantras the languages of abstract and virtual worlds
Digital mantras the languages of abstract and virtual worlds
Author 
Holtzman, Steven R.
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276822
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11. 
Cover image for IBM's 360 and early 370 systems
IBM's 360 and early 370 systems
Author 
Pugh, Emerson W. Johnson, Lyle R. Palmer, John H.
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6267498
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12. 
Cover image for High-tech society the story of the information technology revolution
High-tech society the story of the information technology revolution
Author 
Forester, Tom.
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=6276812
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