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1. 
Cover image for Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Proceedings of the NATO Advanced Study Institute on Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials Algarve, Portugal 1–13 October 2002
Author 
Vilarinho, Paula Maria. editor. Rosenwaks, Yossi. editor. Kingon, Angus. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/1-4020-3019-3
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2. 
Cover image for Nanostructured and Advanced Materials for Applications in Sensor, Optoelectronic and Photovoltaic Technology Proceedings of the NATO Advanced Study Institute on Nanostructured and Advanced Materials for Applications in Sensors, Optoelectronic and Photovoltaic Technology Sozopol, Bulgaria 6–17 September 2004
Nanostructured and Advanced Materials for Applications in Sensor, Optoelectronic and Photovoltaic Technology Proceedings of the NATO Advanced Study Institute on Nanostructured and Advanced Materials for Applications in Sensors, Optoelectronic and Photovoltaic Technology Sozopol, Bulgaria 6–17 September 2004
Author 
Vaseashta, A. editor. Dimova-Malinovska, D. editor. Marshall, J. M. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/1-4020-3562-4
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3. 
Cover image for Functionalized Nanoscale Materials, Devices and Systems
Functionalized Nanoscale Materials, Devices and Systems
Author 
Vaseashta, A. editor. Mihailescu, I. N. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-1-4020-8903-9
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