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1. 
Cover image for Advances in Reliability and System Engineering
Advances in Reliability and System Engineering
Author 
Ram, Mangey. editor. Davim, J. Paulo. editor. (orcid)0000-0002-5659-3111 SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-3-319-48875-2
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2. 
Cover image for Interconnect Reliability in Advanced Memory Device Packaging
Interconnect Reliability in Advanced Memory Device Packaging
Author 
Gan, Chong Leong,. author. Huang, Chen-Yu,. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-26708-6
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3. 
Cover image for Principles of Performance and Reliability Modeling and Evaluation Essays in Honor of Kishor Trivedi on his 70th Birthday
Principles of Performance and Reliability Modeling and Evaluation Essays in Honor of Kishor Trivedi on his 70th Birthday
Author 
Fiondella, Lance. editor. Puliafito, Antonio. editor. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-3-319-30599-8
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4. 
Cover image for Fundamentals of Electromigration-Aware Integrated Circuit Design
Fundamentals of Electromigration-Aware Integrated Circuit Design
Author 
Lienig, Jens. author. (orcid)0000-0002-2140-4587 Rothe, Susann. author. Thiele, Matthias. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-80023-8
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5. 
Cover image for Fundamentals of Electronic Systems Design
Fundamentals of Electronic Systems Design
Author 
Lienig, Jens. author. (orcid)0000-0002-2140-4587 Bruemmer, Hans. author. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-3-319-55840-0
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6. 
Cover image for SiGe-based Re-engineering of Electronic Warfare Subsystems
SiGe-based Re-engineering of Electronic Warfare Subsystems
Author 
Lambrechts, Wynand. author. Sinha, Saurabh. author. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-3-319-47403-8
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