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1. 
Cover image for Lecture Notes in Analog Electronics Testing and Diagnosis of Analog and Mixed-Signal Electronic Circuits
Lecture Notes in Analog Electronics Testing and Diagnosis of Analog and Mixed-Signal Electronic Circuits
Author 
Litovski, Vančo B. author. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-981-97-8257-4
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2. 
Cover image for Testing of Interposer-Based 2.5D Integrated Circuits
Testing of Interposer-Based 2.5D Integrated Circuits
Author 
Wang, Ran. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-54714-5
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3. 
Cover image for Computer-Aided Design of Microfluidic Very Large Scale Integration (mVLSI) Biochips Design Automation, Testing, and Design-for-Testability
Computer-Aided Design of Microfluidic Very Large Scale Integration (mVLSI) Biochips Design Automation, Testing, and Design-for-Testability
Author 
Hu, Kai. author. Chakrabarty, Krishnendu. author. Ho, Tsung-Yi. author. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-3-319-56255-1
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4. 
Cover image for Microfluidic Very Large Scale Integration (VLSI) Modeling, Simulation, Testing, Compilation and Physical Synthesis
Microfluidic Very Large Scale Integration (VLSI) Modeling, Simulation, Testing, Compilation and Physical Synthesis
Author 
Pop, Paul. author. Minhass, Wajid Hassan. author. Madsen, Jan. author. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-3-319-29599-2
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5. 
Cover image for Runtime Reconfiguration in Networked Embedded Systems Design and Testing Practices
Runtime Reconfiguration in Networked Embedded Systems Design and Testing Practices
Author 
Papp, Zoltan. editor. Exarchakos, George. editor. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-981-10-0715-6
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6. 
Cover image for VLSI for Embedded Intelligence Proceedings of the 27th International Symposium, VDAT 2023
VLSI for Embedded Intelligence Proceedings of the 27th International Symposium, VDAT 2023
Author 
Gupta, Anu. editor. Pandey, Jai Gopal. editor. (orcid)0000-0001-9937-7438 Chaturvedi, Nitin. editor. Dwivedi, Devesh. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-97-3756-7
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7. 
Cover image for Emerging VLSI Devices, Circuits and Architectures Proceedings of the 27th International Symposium, VDAT 2023
Emerging VLSI Devices, Circuits and Architectures Proceedings of the 27th International Symposium, VDAT 2023
Author 
Gupta, Anu. editor. Pandey, Jai Gopal. editor. (orcid)0000-0001-9937-7438 Chaturvedi, Nitin. editor. Dwivedi, Devesh. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-981-97-5269-0
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8. 
Cover image for Nanometer CMOS ICs From Basics to ASICs
Nanometer CMOS ICs From Basics to ASICs
Author 
Veendrick, Harry. author. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-3-031-64249-4
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9. 
Cover image for Hardware Security: Challenges and Solutions
Hardware Security: Challenges and Solutions
Author 
Mishra, Ashutosh. editor. Goswami, Mrinal. editor. Kumar, Manoj. editor. (orcid)0000-0001-5113-0639 Rajput, Navin Singh. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-81213-2
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10. 
Cover image for Direct Conversion Semiconductor Radiation Detectors using Si, CdTe and CdZnTe
Direct Conversion Semiconductor Radiation Detectors using Si, CdTe and CdZnTe
Author 
Iniewski, Krzysztof Kris. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-94005-7
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11. 
Cover image for X-ray Photon Processing Detectors Space, Industrial, and Medical applications
X-ray Photon Processing Detectors Space, Industrial, and Medical applications
Author 
Hansson, Conny. editor. Iniewski, Krzysztof (Kris). editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-35241-6
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12. 
Cover image for Interconnect Reliability in Advanced Memory Device Packaging
Interconnect Reliability in Advanced Memory Device Packaging
Author 
Gan, Chong Leong,. author. Huang, Chen-Yu,. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-031-26708-6
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