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1. 
Cover image for The statistical analysis of failure time data
The statistical analysis of failure time data
Author 
Kalbfleisch, J. D. Prentice, Ross L.
Preferred Shelf Number 
ONLINE
Electronic Access 
John Wiley http://dx.doi.org/10.1002/9781118032985
http://public.eblib.com/EBLPublic/PublicView.do?ptiID=708259
Contributor biographical information http://catdir.loc.gov/catdir/bios/wiley044/2002068965.html
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2. 
Cover image for Accelerated life testing of one-shot devices : data collection and analysis
Accelerated life testing of one-shot devices : data collection and analysis
Author 
Balakrishnan, N., 1956- author. Ling, Man Ho, author. So, Hon Yiu, author.
Preferred Shelf Number 
TA169.3 .B35 2021
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119664031
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3. 
Cover image for Chi-squared goodness-of-fit tests for censored data
Chi-squared goodness-of-fit tests for censored data
Author 
Nikulin, M. S. (Mikhail Stepanovich), author. Chimitova, Ekaterina V., author.
Preferred Shelf Number 
QA277.3
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119427605
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4. 
Cover image for Counting processes and survival analysis
Counting processes and survival analysis
Author 
Fleming, Thomas R. Harrington, David P. Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
Wiley InterScience An electronic book accessible through the World Wide Web; click for information
Spis treści http://catdir.loc.gov/catdir/toc/fy0604/2005283512.html
ebrary http://site.ebrary.com/id/10509867
http://site.ebrary.com/lib/alltitles/Doc?id=10509867
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