Switch to list view
Switch to thumbnail view
Select an Action
2 Results Found Subscribe to search results
00DEFAULT
Print
1. 
Cover image for Reliability prediction for microelectronics
Reliability prediction for microelectronics
Author 
Bernstein, Joseph B., author. Bensoussan, Alain A., author. Bender, Emmanuel (Carl), author.
Preferred Shelf Number 
TK7874
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781394210961
Format: 
Availability 
Online Library~1
Available:
Copies:
2. 
Cover image for 75th anniversary of the transistor
75th anniversary of the transistor
Author 
Nathan, Arokia, 1957- editor. Saha, Samar K., editor. Todi, Ravi M., editor.
Preferred Shelf Number 
TK7871.9
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781394202478
Format: 
Availability 
Online Library~1
Available:
Copies: