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1. 
Cover image for Future trends in microelectronics from nanophotonics to sensors and energy
Future trends in microelectronics from nanophotonics to sensors and energy
Author 
Luryi, Serge. Xu, Jimmy. Zaslavsky, Alexander.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5599322
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2. 
Cover image for Future trends in microelectronics up the nano creek
Future trends in microelectronics up the nano creek
Author 
FTM-5 (2006 : Crete, Greece) Luryi, Serge. Xu, Jimmy. Zaslavsky, Alex, 1963-
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5201522
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3. 
Cover image for CMOS biomicrosystems where electronics meet biology
CMOS biomicrosystems where electronics meet biology
Author 
Iniewski, Krzysztof, 1960- Wiley InterScience (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5988887
IEEE Xplore http://ieeexplore.ieee.org/servlet/opac?bknumber=5988887
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4. 
Cover image for Design for embedded image processing on FPGAs
Design for embedded image processing on FPGAs
Author 
Bailey, Donald G. (Donald Graeme), 1962-
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IEEE Xplore http://ieeexplore.ieee.org/servlet/opac?bknumber=6016259
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5. 
Cover image for Networks-on-Chips : Theory and Practice
Networks-on-Chips : Theory and Practice
Author 
El-Kharashi, Mohamed Watheq, editor. Elmiligi, Haytham, editor. Gebali, Fayez, editor. Taylor and Francis.
Preferred Shelf Number 
TK5105.546
Electronic Access 
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6. 
Cover image for Advanced signal integrity for high-speed digital designs
Advanced signal integrity for high-speed digital designs
Author 
Hall, Stephen H. Heck, Howard L.
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ONLINE
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361024
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7. 
Cover image for Electrostatic discharge understand, simulate and fix ESD problems
Electrostatic discharge understand, simulate and fix ESD problems
Author 
Mardiguian, Michel.
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ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361037
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8. 
Cover image for Reliability wearout mechanisms in advanced CMOS technologies
Reliability wearout mechanisms in advanced CMOS technologies
Author 
Strong, Alvin Wayne, 1946-
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5361029
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9. 
Cover image for Managing power electronics VLSI and DSP-driven computer systems
Managing power electronics VLSI and DSP-driven computer systems
Author 
Rossetti, Nazzareno, 1951-
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5236490
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10. 
Cover image for Micromechanics and MEMS classic and seminal papers to 1990
Micromechanics and MEMS classic and seminal papers to 1990
Author 
Trimmer, W. Institute of Electrical and Electronics Engineers.
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ONLINE
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IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5273520
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11. 
Cover image for Routing in the third dimension from VLSI chips to MCMs
Routing in the third dimension from VLSI chips to MCMs
Author 
Sherwani, N. A. (Naveed A.) Bhingarde, Siddharth. Panyam, Anand.
Preferred Shelf Number 
ONLINE
Electronic Access 
IEEE Xplore http://ieeexplore.ieee.org/xpl/bkabstractplus.jsp?bkn=5263943
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