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1. 
Cover image for VLSI Design and Test for Systems Dependability
VLSI Design and Test for Systems Dependability
Author 
Asai, Shojiro. editor. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-4-431-56594-9
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2. 
Cover image for Reliability Physics and Engineering Time-To-Failure Modeling
Reliability Physics and Engineering Time-To-Failure Modeling
Author 
McPherson, J. W. author. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-3-319-93683-3
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3. 
Cover image for RF and Microwave Microelectronics Packaging II
RF and Microwave Microelectronics Packaging II
Author 
Kuang, Ken. editor. Sturdivant, Rick. editor. SpringerLink (Online service)
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ONLINE
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https://doi.org/10.1007/978-3-319-51697-4
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4. 
Cover image for Parallel Power Electronics Filters in Three-Phase Four-Wire Systems Principle, Control and Design
Parallel Power Electronics Filters in Three-Phase Four-Wire Systems Principle, Control and Design
Author 
Wong, Man-Chung. author. Dai, Ning-Yi. author. Lam, Chi-Seng. author. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-981-10-1530-4
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5. 
Cover image for Design of Reconfigurable Logic Controllers
Design of Reconfigurable Logic Controllers
Author 
Karatkevich, Andrei. editor. Bukowiec, Arkadiusz. editor. Doligalski, Michał. editor. Tkacz, Jacek. editor. SpringerLink (Online service)
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ONLINE
Electronic Access 
https://doi.org/10.1007/978-3-319-26725-8
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6. 
Cover image for Innovations and Advances in Computing, Informatics, Systems Sciences, Networking and Engineering
Innovations and Advances in Computing, Informatics, Systems Sciences, Networking and Engineering
Author 
Sobh, Tarek. editor. Elleithy, Khaled. editor. SpringerLink (Online service)
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Electronic Access 
https://doi.org/10.1007/978-3-319-06773-5
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7. 
Cover image for Bias Temperature Instability for Devices and Circuits
Bias Temperature Instability for Devices and Circuits
Author 
Grasser, Tibor. editor. SpringerLink (Online service)
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https://doi.org/10.1007/978-1-4614-7909-3
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