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1. 
Cover image for Alternating Current Field Measurement Technique for Detection and Measurement of Cracks in Structures
Alternating Current Field Measurement Technique for Detection and Measurement of Cracks in Structures
Author 
Li, Wei. author. Yuan, Xin'an. author. Zhao, Jianming. author. Yin, Xiaokang. author. Li, Xiao. author.
Preferred Shelf Number 
ONLINE
Electronic Access 
https://doi.org/10.1007/978-981-97-7255-1
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2. 
Cover image for Metal oxide semiconductors : synthesis, properties, and devices
Metal oxide semiconductors : synthesis, properties, and devices
Author 
Zang, Zhigang, author Cai, Wensi, author. Zhou, Yong, author.
Preferred Shelf Number 
TK7871.99 .M44
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9783527842551
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3. 
Cover image for Electrospinning : fundamentals, methods, and applications
Electrospinning : fundamentals, methods, and applications
Author 
Wang, Liming, editor. Qin, Xiaohong, editor.
Preferred Shelf Number 
TA418.9 .F5
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9783527841479
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4. 
Cover image for 75th anniversary of the transistor
75th anniversary of the transistor
Author 
Nathan, Arokia, 1957- editor. Saha, Samar K., editor. Todi, Ravi M., editor.
Preferred Shelf Number 
TK7871.9
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781394202478
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5. 
Cover image for From additive manufacturing to 3D/4D printing. 2, Current techniques, improvements and their limitations
From additive manufacturing to 3D/4D printing. 2, Current techniques, improvements and their limitations
Author 
André, Jean-Claude, author.
Preferred Shelf Number 
TS171.95
Electronic Access 
https://onlinelibrary.wiley.com/doi/book/10.1002/9781119428299
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