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1. 
Cover image for Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition
Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits 2nd Edition
Author 
Sachdev, Manoj. editor. Gyvez, José Pineda de. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/0-387-46547-2
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2. 
Cover image for Proceedings of the FISITA 2012 World Automotive Congress Volume 8: Vehicle Design and Testing (II).
Proceedings of the FISITA 2012 World Automotive Congress Volume 8: Vehicle Design and Testing (II).
Author 
SAE-China. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333744.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-33738-3
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3. 
Cover image for Proceedings of the FISITA 2012 World Automotive Congress Volume 7: Vehicle Design and Testing (I).
Proceedings of the FISITA 2012 World Automotive Congress Volume 7: Vehicle Design and Testing (I).
Author 
SAE-China. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE(333763.1)
Electronic Access 
http://dx.doi.org/10.1007/978-3-642-33835-9
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4. 
Cover image for Reliability verification, testing and analysis in engineering design
Reliability verification, testing and analysis in engineering design
Author 
Wasserman, Gary S., 1951-
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ONLINE
Electronic Access 
Distributed by publisher. Purchase or institutional license may be required for access.
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5. 
Cover image for Oscillation-Based Test in Mixed-Signal Circuits
Oscillation-Based Test in Mixed-Signal Circuits
Author 
Sánchez, Gloria Huertas. author. García de la Vega, Diego Vázquez. author. Rueda, Adoración Rueda. author. Díaz, José Luis Huertas. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/1-4020-5315-0
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6. 
Cover image for Gizopoulos / Advances in ElectronicTesting
Gizopoulos / Advances in ElectronicTesting
Author 
Gizopoulos, Dimitris. editor. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/0-387-29409-0
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7. 
Cover image for Digital Timing Measurements From Scopes and Probes to Timing and Jitter
Digital Timing Measurements From Scopes and Probes to Timing and Jitter
Author 
Maichen, Wolfgang. author. SpringerLink (Online service)
Preferred Shelf Number 
ONLINE
Electronic Access 
http://dx.doi.org/10.1007/978-0-387-31419-8
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8. 
Cover image for Introduction to Advanced System-on-Chip Test Design and Optimization
Introduction to Advanced System-on-Chip Test Design and Optimization
Author 
Larsson, Erik. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b135763
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9. 
Cover image for Fault Diagnosis of Analog Integrated Circuits
Fault Diagnosis of Analog Integrated Circuits
Author 
Kabisatpathy, Prithviraj. author. Barua, Alok. author. Sinha, Satyabroto. author. SpringerLink (Online service)
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ONLINE
Electronic Access 
http://dx.doi.org/10.1007/b135977
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10. 
Cover image for Make and test projects in engineering design : creativity, engagement and learning
Make and test projects in engineering design : creativity, engagement and learning
Author 
Samuel, A. E. (Andrew E.), 1931-
Preferred Shelf Number 
TA174 .S268 2006
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