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1. 
Cover image for System Dependability Evaluation Including S-dependency and Uncertainty Model-Driven Dependability Analyses
System Dependability Evaluation Including S-dependency and Uncertainty Model-Driven Dependability Analyses
Author 
Kochs, Hans-Dieter. author. SpringerLink (Online service)
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https://doi.org/10.1007/978-3-319-64991-7
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2. 
Cover image for Requirements Engineering and Management for Software Development Projects
Requirements Engineering and Management for Software Development Projects
Author 
Chemuturi, Murali. author. SpringerLink (Online service)
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ONLINE(331756.1)
Electronic Access 
http://dx.doi.org/10.1007/978-1-4614-5377-2
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3. 
Cover image for Design, Analysis and Test of Logic Circuits Under Uncertainty
Design, Analysis and Test of Logic Circuits Under Uncertainty
Author 
Krishnaswamy, Smita. author. Markov, Igor L. author. Hayes, John P. author. SpringerLink (Online service)
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ONLINE(335669.1)
Electronic Access 
http://dx.doi.org/10.1007/978-90-481-9644-9
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4. 
Cover image for Fault-Tolerant Design
Fault-Tolerant Design
Author 
Dubrova, Elena. author. SpringerLink (Online service)
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ONLINE(331297.1)
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http://dx.doi.org/10.1007/978-1-4614-2113-9
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5. 
Cover image for Test and Diagnosis for Small-Delay Defects
Test and Diagnosis for Small-Delay Defects
Author 
Tehranipoor, Mohammad. author. Peng, Ke. author. Chakrabarty, Krishnendu. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-8297-1
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6. 
Cover image for Dependability of Networked Computer-based Systems
Dependability of Networked Computer-based Systems
Author 
Verma, Ajit Kumar. author. Ajit, Srividya. author. Kumar, Manoj. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-85729-318-3
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7. 
Cover image for Predictive Technology Model for Robust Nanoelectronic Design
Predictive Technology Model for Robust Nanoelectronic Design
Author 
Cao, Yu. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4614-0445-3
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8. 
Cover image for Trustworthy Internet
Trustworthy Internet
Author 
Salgarelli, Luca. editor. Bianchi, Giuseppe. editor. Blefari-Melazzi, Nicola. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-88-470-1818-1
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9. 
Cover image for VLSI 2010 Annual Symposium Selected papers
VLSI 2010 Annual Symposium Selected papers
Author 
Voros, Nikolaos. editor. Mukherjee, Amar. editor. Sklavos, Nicolas. editor. Masselos, Konstantinos. editor. Huebner, Michael. editor.
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http://dx.doi.org/10.1007/978-94-007-1488-5
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10. 
Cover image for Software Reliability Assessment with OR Applications
Software Reliability Assessment with OR Applications
Author 
Kapur, P.K. author. Pham, Hoang. author. Gupta, A. author. Jha, P.C. author. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-0-85729-204-9
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11. 
Cover image for Soft Errors in Modern Electronic Systems
Soft Errors in Modern Electronic Systems
Author 
Nicolaidis, Michael. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-1-4419-6993-4
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12. 
Cover image for Models in Hardware Testing Lecture Notes of the Forum in Honor of Christian Landrault
Models in Hardware Testing Lecture Notes of the Forum in Honor of Christian Landrault
Author 
Wunderlich, Hans-Joachim. editor. SpringerLink (Online service)
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http://dx.doi.org/10.1007/978-90-481-3282-9
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