chapter 1 The Big Picture -- chapter 2 A Brief History of the Field -- part 3 Overview: SiGe HBTs -- chapter 4 Device Physics -- chapter 5 Second-Order Effects -- chapter 6 Low-Frequency Noise -- chapter 7 Broadband Noise -- chapter 8 Microscopic Noise Simulation -- chapter 9 Linearity -- chapter 10 pnp SiGe HBTs -- chapter 11 Temperature Effects -- chapter 12 Radiation Effects -- chapter 13 Reliability Issues -- chapter 14 Self-Heating and Thermal Effects -- chapter 15 Device-Level Simulation -- chapter 16 SiGe HBT Performance Limits -- part 17 Overview: Heterostructure FETs -- chapter 18 Biaxial Strained Si CMOS -- chapter 19 Uniaxial Stressed Si MOSFET -- chapter 20 SiGe-Channel HFETs -- chapter 21 Industry Examples at the State-of-the-Art: Intel's 90nm Logic Technologies -- part 22 Overview: Other Heterstructure Devices -- chapter 23 Resonant Tunneling Devices -- chapter 24 IMPATT Diodes -- chapter 25 Engineered Substrates for Electronic and Optoelectronic Systems -- chapter 26 Self-Assembling Nanostructures in Ge(Si)-Si Heteropitaxy -- part 27 Overview: Optoelectronic Components -- chapter 28 Si-Si Ge LEDs -- chapter 29 Near-Infrared Detectors -- chapter 30 Si-Based Photonic Transistor Devices for Integrated Optoelectronics -- chapter 31 Si-SiGe Quantum Cascade Emitters.